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Zeitschriftenartikel:

H.-C. Hou, D. Süss, J.W. Liao, M.-S. Lin, H.-J. Lin, F.-H. Chang, C.-H. Lai:
"Direct probing magnetization reversal of exchange-coupled-composite media by x-ray magnetic circular dichroism";
Applied Physics Letters, 98 (2011), 262507; S. 1 - 3.



Kurzfassung englisch:
X-ray magnetic circular dichroism (XMCD) was used to directly probe the depth-dependent
magnetization reversal of CoPtCr-SiO2-based exchange-coupled-composite media with laminated
soft layers. A thin Fe-marker layer in the soft layer was used as the indicator of local magnetization.
Element-specific XMCD loops of Fe-marker layers confirmed the transition of the magnetization
reversal from rigid magnets to exchange-spring magnets with increasing thickness of the soft layer.
The micromagnetic simulations revealed the importance of the reduced exchange constant (Asoft) by
laminating the soft layer for domain-wall assisting reversal. By comparing XMCD loops with
simulations, we can deduce the effective Asoft.


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1063/1.3603945


Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.