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Publikationsliste für
Peter Schattschneider
als Autorin / Autor bzw. wesentlich beteiligte Person

580 Datensätze (1999 - 2019)

Die Publikationen der Fakultät für Physik sind erst ab dem Jahr 2002 vollzählig in der Publikationsdatenbank enthalten. Publikationen aus den Jahren vor 2002 können, müssen aber nicht in der Datenbank vorhanden sein.


Bücher und Buch-Herausgaben


  1. J. Luitz, C. Hébert, P. Schattschneider (Hrg.):
    "AK EELS-EFTEM 5. Workshop on Electron Loss Spectrometry and Engergy Filtering";
    Editio Amici - Physicae et chimicae solidorum amici, Beatrixg. 26/86, A-1030 Wien, Austria, 2006, ISBN: 978-3-902548-01-6.

  2. J. Luitz, C. Hébert, K. Weinmeier, P. Blaha, C. Ambrosch-Draxl, P. Schattschneider (Hrg.):
    "DFTEM 2006, bringing together tow communities - International Conference on Density Functional Theory and Transmission Electron Microscopy";
    Editio Amici - Physicae et chimicae solidorum amici, 2006, ISBN: 978-3-902548-00-9.

  3. P. Schattschneider (Hrg.):
    "Linear and Chiral Dichroism in the Electron Microscope";
    Pan Stanford Publishing Pte.Ltd., Singapore, 2012, ISBN: 978-981-4267-48-9; 262 S.


Zeitschriftenartikel


  1. A. Auge, N. Teichert, M. Meinert, G. Reiss, A. Hütten, E. Yüzüak, I. Dincer, Y. Elerman, I. Ennen, P. Schattschneider:
    "Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films";
    Physical Review B, 85 (2012), 21; S. 214118-1 - 214118-8.

    Zusätzliche Informationen

  2. K. Bliokh, I. Ivanov, G. Guzzinati, L. Clark, R. Van Boxem, A. Béché, R. Juchtmans, M. Alonso, P. Schattschneider, F. Nori, J. Verbeeck:
    "Theory and applications of free-electron vortex states";
    Physics Reports, 690 (2017), S. 1 - 70.

    Zusätzliche Informationen

  3. K. Bliokh, P. Schattschneider, J. Verbeeck, F. Nori:
    "Electron Vortex Beams in a Magnetic Field: A New Twist on Landau Levels and Aharonov-Bohm States";
    Physical Review X, 2 (2012), S. 041011-1 - 041011-15.

    Zusätzliche Informationen

  4. M. Bugnet, S. Löffler, D. Hawthorn, H. Dabkowska, G. Luke, P. Schattschneider, G. Sawatzky, G. Radtke, G. A. Botton:
    "Real-space localization and quantification of hole distribution in chain-ladder Sr3Ca11Cu24O41 superconductor";
    Science Advances, 2 (2016), 3.

    Zusätzliche Informationen

  5. L. Calmels, F. Houdellier, B. Warot-Fonrose, C. Gatel, M.J. Hytch, V. Serin, E. Snoeck, P. Schattschneider:
    "Experimental application of sum rules for electron energy loss magnetic chiral dichroism";
    Physical Review B, 76 (2007), S. 060409-1 - 060409-4.

    Zusätzliche Informationen

  6. I. Ennen, S. Löffler, C. Kübel, D. Wang, A. Auge, A. Hütten, P. Schattschneider:
    "Site-specific chirality in magnetic transitions";
    Journal of Magnetism and Magnetic Materials, 324 (2012), 18; S. 2723 - 2726.

    Zusätzliche Informationen

  7. D. Eyidi, C. Hébert, P. Schattschneider:
    "Short note on parallel illumination in the TEM";
    Ultramicroscopy, 106 (2006), 11-12; S. 1144 - 1149.

    Zusätzliche Informationen

  8. Z. Feng, S. Löffler, F. Eder, D. Su, J. Meyer, P. Schattschneider:
    "Combined study of the ground and unoccupied electronic states of graphite by electron energy-loss spectroscopy";
    Journal of Applied Physics, 114 (2013), S. 183716-1 - 183716-8.

    Zusätzliche Informationen

  9. S.D. Findlay, P. Schattschneider, L.J. Allen:
    "Imaging using inelastically scattered electrons in CTEM and STEM geometry";
    Ultramicroscopy, 108 (2007), S. 58 - 67.

    Zusätzliche Informationen

  10. T. Galek, C. Hébert, D. Eyidi, T. Moskalewicz, P. Schattschneider, H. Figiel:
    "Electron energy-loss spectroscopy investigations of the electron density in ErMn2 and ErMn2D2 compounds";
    Journal of Physics: Condensed Matter, 17 (2005), S. 3657 - 3664.

    Zusätzliche Informationen

  11. S. Gall, J. Schneider, J. Klein, K. Hübener, M. Muske, B. Rau, E. Conrad, I. Sieber, K. Petter, K. Lips, M. Stöger-Pollach, P. Schattschneider, W. Fuhs:
    "Large-grained polycrystalline silicon on glass for thin-film solar cells";
    Thin Solid Films, 511-512 (2006), S. 7 - 14.

    Zusätzliche Informationen

  12. C. Gatel, B. Warot-Fonrose, P. Schattschneider:
    "Distortion corrections of ESI data cubes for magnetic studies";
    Ultramicroscopy, 109 (2009), 12; S. 1465 - 1471.

    Zusätzliche Informationen

  13. G. Guzzinati, P. Schattschneider, K. Bliokh, F. Nori, J. Verbeeck:
    "Observation of the Larmor and Gouy Rotations with Electron Vortex Beams";
    Physical Review Letters, 110 (2013), 9; S. 093601-1 - 093601-5.

    Zusätzliche Informationen

  14. C. Hébert, A. Alkauskas, S. Löffler, B. Jouffrey, P. Schattschneider:
    "Capturing EELS in the reciprocal space";
    European Physical Journal - Applied Physics, 54 (2011), 3; S. 33510-1 - 33510-7.

    Zusätzliche Informationen

  15. C. Hébert, B. Jouffrey, P. Schattschneider:
    "Comment on "Experimental and theoretical evidence for the magic angle in transmission electron energy loss spectroscopy" by H. Daniels, A. Brown, A. Scott, T. Nichells, B. Rand and R. Brydson";
    Ultramicroscopy, 101 (2004), S. 271 - 273.

  16. C. Hébert, J. Luitz, P. Schattschneider:
    "Improvement of energy loss near edge structure calculation using Wien2k";
    Micron, 34 (2003), S. 219 - 225.

    Zusätzliche Informationen

  17. C. Hébert, P. Schattschneider:
    "A proposal for dichroic experiments in the electron microscope";
    Ultramicroscopy, 96 (2003), S. 463 - 468.

    Zusätzliche Informationen

  18. C. Hébert, P. Schattschneider:
    "Density Functional Theory as a Tool for the Electron Microscopist";
    Microscopy and Microanalysis, 8 (2002), Suppl. 2; S. 1594CD - 1595CD.

  19. C. Hébert, P. Schattschneider, H. Franco, B. Jouffrey:
    "ELNES at magic angle conditions";
    Ultramicroscopy, 106 (2006), 11-12; S. 1139 - 1143.

    Zusätzliche Informationen

  20. C. Hébert, P. Schattschneider, St. Rubino, P. Novák, J. Rusz, M. Stöger-Pollach:
    "Magnetic circular dichroism in electron energy loss spectrometry";
    Ultramicroscopy, 108 (2008), S. 277 - 284.

    Zusätzliche Informationen

  21. C. Hébert, M. Willinger, D.S. Su, P. Pongratz, P. Schattschneider, R. Schlögl:
    "Oxygen K-Edge in Vanadium Oxides: Simulations and Experiments";
    European Physical Journal B, 28 (2002), S. 407 - 414.

  22. W. Hetaba, P. Blaha, F. Tran, P. Schattschneider:
    "Calculating energy loss spectra of NiO: Advantages of the modified Becke-Johnson potential";
    Physical Review B, 85 (2012), S. 205108.

  23. W. Hetaba, S. Löffler, M.-G. Willinger, M. E. Schuster, R. Schlögl, P. Schattschneider:
    "Site-specific ionisation edge fine-structure of Rutile in the electron microscope";
    Micron, 63 (2014), S. 15 - 19.

    Zusätzliche Informationen

  24. F. Houdellier, B. Warot-Fonrose, M.J. Hytch, E. Snoeck, L. Calmels, V. Serin, P. Schattschneider:
    "New Electron Energy Loss Magnetic Chiral Dichroïsm (EMCD) configuration using an aberration-corrected transmission electron microscope";
    Microscopy and Microanalysis, 13 (2007), S. 48.

    Zusätzliche Informationen

  25. C. Hurm, M. Stöger-Pollach, St. Rubino, C. Hébert, P. Schattschneider, J. Zweck:
    "Verification of Electron Magnetic Chiral Dichroism in a TEM by Reversing the Specimen's Magnetisation";
    Microscopy and Microanalysis, Vol. 13 (2007), 3; S. 12 - 13.

    Zusätzliche Informationen

  26. B. Jouffrey, P. Schattschneider, C. Hébert:
    "Inelastic Events: some Underlying Physics and their Use in Electron Microscopy";
    European Microscopy Society, - (2002), S. 63 - 65.

  27. B. Jouffrey, P. Schattschneider, C. Hébert:
    "The magic angle: a solved mystery";
    Ultramicroscopy, 102 (2004), S. 61 - 66.

    Zusätzliche Informationen

  28. C. Kramberger, S. Löffler, T. Schachinger, P. Hartel, J. Zach, P. Schattschneider:
    "π/2 mode converters and vortex generators for electrons";
    Ultramicroscopy, 204 (2019), S. 27 - 33.

  29. J. Kusinski, G. Petot-Ervas, C. Petot, B. Jouffrey, P. Schattschneider:
    "Microstructure and nanochemistry of Ca-doped cobalt oxide single crystals";
    Materials Chemistry and Physics, 81 (2003), S. 308 - 311.

    Zusätzliche Informationen

  30. S. Löffler, M. Bugnet, N. Gauquelin, S. Lazar, E. Assmann, K. Held, G. A. Botton, P. Schattschneider:
    "Real-space mapping of electronic orbitals";
    Ultramicroscopy, 177 (2017), S. 26 - 29.

    Zusätzliche Informationen

  31. S. Löffler, I. Ennen, F. Tian, P. Schattschneider, N. Jaouen:
    "Breakdown of the dipole approximation in core losses";
    Ultramicroscopy, 111 (2011), 8; S. 1163 - 1167.

    Zusätzliche Informationen

  32. S. Löffler, V. Motsch, P. Schattschneider:
    "A pure state decomposition approach of the mixed dynamic form factor for mapping atomic orbitals";
    Ultramicroscopy, 131 (2013), S. 39 - 45.

    Zusätzliche Informationen

  33. S. Löffler, P. Schattschneider:
    "A software package for the simulation of energy-loss magnetic chiral dichroism";
    Ultramicroscopy, 110 (2010), 7; S. 831 - 835.

    Zusätzliche Informationen

  34. S. Löffler, P. Schattschneider:
    "Elastic propagation of fast electron vortices through crystals";
    Acta Crystallographica Section A, 68 (2012), 4; S. 443 - 447.

    Zusätzliche Informationen

  35. S. Löffler, P. Schattschneider:
    "Transition probability functions for applications of inelastic electron scattering";
    Micron, Vol. 43 (2012), 9; S. 971 - 977.

    Zusätzliche Informationen

  36. V. Mauchamp, M. Jaouen, P. Schattschneider:
    "Core-hole effect in the one-particle approximation revisited from density functional theory";
    Physical Review B, 79 (2009), S. 235106-1 - 235106-16.

    Zusätzliche Informationen

  37. C. Mitterbauer, C. Hébert, G. Kothleitner, F. Hofer, P. Schattschneider, H.W. Zandbergen:
    "Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides";
    Solid State Communications, 130 (2004), S. 209 - 213.

    Zusätzliche Informationen

  38. K. Müller, F. Krause, A. Béché, M. Schowalter, V. Galioit, S. Löffler, J. Verbeeck, J. Zweck, P. Schattschneider, A. Rosenauer:
    "Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction";
    Nature Communications, 5 (2014), S. 5653.

    Zusätzliche Informationen

  39. K. Müller-Caspary, F. Krause, A. Béché, M. Duchamp, M. Schowalter, S. Löffler, V. Migunov, F. Winkler, M. Huth, R. Ritz, S. Ihle, M. Simson, H. Ryll, H. Soltau, L. Strüder, J. Zweck, P. Schattschneider, R. Dunin-Borkowski, J. Verbeek, A. Rosenauer:
    "Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors";
    Microscopy and Microanalysis, 22 (2016), 3; S. 484 - 485.

  40. K. Müller-Caspary, F. Krause, T. Grieb, S. Löffler, M. Schowalter, A. Béché, V. Galioit, D. Marquardt, J. Zweck, P. Schattschneider, J. Verbeeck, A. Rosenauer:
    "Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy";
    Ultramicroscopy, 178 (2017), S. 62 - 80.

    Zusätzliche Informationen

  41. C. Ornaghi, M. Stöger-Pollach, G. Beaucarne, P. Schattschneider:
    "Thin film polycrystalline silicon solar cell on ceramics with a seeding layer formed via aluminium-induced crystallisation of amorphous silicon";
    IEEE Proc.-Circuits Devices Syst., Vol. 150 (2003), No. 4; S. 287 - 292.

  42. L. Pardini, S. Löffler, G. Biddau, R. Hambach, U. Kaiser, C. Draxl, P. Schattschneider:
    "Mapping Atomic Orbitals with the Transmission Electron Microscope: Images of Defective Graphene Predicted from First-Principles Theory";
    Physical Review Letters, 117 (2016), S. 036801 - 036805.

    Zusätzliche Informationen

  43. K. Petter, D. Eyidi, M. Stöger-Pollach, I. Sieber, P. Schubert-Bischoff, B. Rau, A. Tham, P. Schattschneider, S. Gall, K. Lips, W. Fuhs:
    "Line defects in epitaxial silicon silicon films grown at 560°C";
    Physica B: Condensed Matter, 376-377 (2006), S. 117 - 121.

    Zusätzliche Informationen

  44. K. Petter, D. Eyidi, M. Stöger-Pollach, I. Sieber, P. Schubert-Bischoff, B. Rau, A.T. Tham, P. Schattschneider, S. Gall, K. Lips, W. Fuhs:
    "Line defects in epitaxial silicon films grown at 560°C";
    Physica B: Condensed Matter, 376-377 (2006), S. 117 - 121.

    Zusätzliche Informationen

  45. P. L. Potapov, J. Verbeeck, P. Schattschneider, H. Lichte, D. Van Dyck:
    "Inelastic electron holography as a variant of the Feynman thought experiment";
    Ultramicroscopy, 107 (2007), S. 559 - 567.

    Zusätzliche Informationen

  46. B. Rau, K. Petter, I. Sieber, M. Stöger-Pollach, D. Eyidi, P. Schattschneider, S. Gall, K. Lips, W. Fuhs:
    "Extended defects in Si films epitaxially grown by low-temperature ECRCVD";
    Journal of Crystal Growth, 287 (2006), S. 433 - 437.

    Zusätzliche Informationen

  47. B. Rau, K. Petter, I. Sieber, M. Stöger-Pollach, D. Eyidi, P. Schattschneider, S. Gall, K. Lips, W. Fuhs:
    "Extended defects in Si films epitaxially grown by low-temperature ECRCVD";
    Journal of Crystal Growth, 287 (2006), S. 433 - 437.

    Zusätzliche Informationen

  48. B. Rau, I. Sieber, J. Schneider, M. Muske, M. Stöger-Pollach, P. Schattschneider, S. Gall, W. Fuhs:
    "Low-temperature Si epitaxy on large-grained polycrystalline seed layers by electron-cyclotron resonance chemical vapor deposition";
    Journal of Crystal Growth, 270 (2004), S. 396 - 401.

  49. S. Rubino, P. Schattschneider, J. Rusz, J. Verbeeck, K. Leifer:
    "Simulation of magnetic circular dichroism in the electron microscope";
    Journal of Physics D: Applied Physics, 43 (2010), 47; S. 1 - 11.

    Zusätzliche Informationen

  50. St. Rubino, P. Schattschneider, M. Stöger-Pollach, C. Hébert, J. Rusz, L. Calmels, B. Warot-Fonrose, F. Houdellier, V. Serin, P. Novák:
    "Outstanding Symposium Paper/Review: Energy-loss magnetic chiral dichroism (EMCD): Magnetic chiral dichroism in the electron microscope";
    International Journal of Materials Research, 23 (2008), 10; S. 2582 - 2590.

    Zusätzliche Informationen

  51. J. Rusz, P. Novák, St. Rubino, C. Hébert, P. Schattschneider:
    "Magnetic Circular Dichroism in Electron Microscopy";
    Acta Physica Polonica A, Vol. 113 (2008), 1; S. 599 - 604.

    Zusätzliche Informationen

  52. J. Rusz, St. Rubino, P. Schattschneider:
    "First-principles theory of chiral dichroism in electron microscopy applied to 3d ferromagnets";
    Physical Review B, 75 (2007), S. 214425-1 - 214425-9.

    Zusätzliche Informationen

  53. T. Schachinger, S. Löffler, A. Steiger-Thirsfeld, M. Stöger-Pollach, S. Schneider, D. Pohl, B. Rellinghaus, P. Schattschneider:
    "EMCD with an electron vortex filter: Limitations and possibilities";
    Ultramicroscopy, 179 (2017), S. 15 - 23.

    Zusätzliche Informationen

  54. T. Schachinger, S. Löffler, M. Stöger-Pollach, P. Schattschneider:
    "Peculiar rotation of electron vortex beams";
    Ultramicroscopy, 158 (2015), S. 17 - 25.

    Zusätzliche Informationen

  55. P. Schattschneider:
    "Exchange of angular momentum in EMCD experiments";
    Ultramicroscopy, 109 (2008), S. 91 - 95.

    Zusätzliche Informationen

  56. P. Schattschneider:
    "Kilo und Meter fit für die Zukunft";
    c't, 24 (2018), S. 42 - 43.

  57. P. Schattschneider:
    "Spintronik: Nanomagnetische Eigenschaften im Elektronenmikroskop";
    Physik in unserer Zeit, 37 (2006), 5; S. 208 - 209.

    Zusätzliche Informationen

  58. P. Schattschneider, I. Ennen, S. Löffler, M. Stöger-Pollach, J. Verbeeck:
    "Circular dichroism in the electron microscope: Progress and applications";
    Journal of Applied Physics (eingeladen), 107 (2010), 09D311; S. 1 - 6.

  59. P. Schattschneider, I. Ennen, M. Stöger-Pollach, J. Verbeeck, V. Mauchamp, M. Jaouen:
    "Real space maps of magnetic moments on the atomic scale: Theory and feasibility";
    Ultramicroscopy, 110 (2010), 8; S. 1038 - 1041.

    Zusätzliche Informationen

  60. P. Schattschneider, C. Hébert, H. Franco, B. Jouffrey:
    "Anisotropic relativistic cross sections for inelastic electron scattering, and the magic angle";
    Physical Review B, 72 (2005), S. 045142-1 - 045142-8.

    Zusätzliche Informationen

  61. P. Schattschneider, C. Hébert, B. Jouffrey:
    "Localization of Low Energy Losses and the Mixed Dynamic Form Factor";
    Microscopy and Microanalysis, 8 (2002), Suppl. 2; S. 636CD - 637CD.

  62. P. Schattschneider, C. Hébert, St. Rubino, M. Stöger-Pollach, J. Rusz, P. Novák:
    "Magnetic circular dichroism in EELS: Towards 10 nm resolution";
    Ultramicroscopy, 108 (2008), S. 433 - 438.

    Zusätzliche Informationen

  63. P. Schattschneider, C. Hébert, M. Stöger-Pollach:
    "Electron energy-loss spectrometry for metals: some thoughts beyond microanalysis";
    International Journal of Materials Research, 97 (2006), 7; S. 920 - 927.

    Zusätzliche Informationen

  64. P. Schattschneider, B. Jouffrey:
    "Channeling, localization and the density matrix in inelastic electron scattering";
    Ultramicroscopy, 96 (2003), S. 453 - 462.

    Zusätzliche Informationen

  65. P. Schattschneider, B. Jouffrey:
    "Correlation in the Al plasma excitation";
    European Physical Journal B, 37 (2004), No. 1; S. 3 - 6.

  66. P. Schattschneider, H. Lichte:
    "Correlation and the density-matrix approach to inelastic electron holography in solid state plasmas";
    Physical Review B, 71 (2005), S. 045130-1 - 045130-9.

    Zusätzliche Informationen

  67. P. Schattschneider, S. Löffler:
    "Entanglement and decoherence in electron microscopy";
    Ultramicroscopy, 190 (2018), S. 39 - 44.

    Zusätzliche Informationen

  68. P. Schattschneider, S. Löffler, H. Gollisch, R. Feder:
    "Entanglement and entropy in electron-electron scattering";
    Journal of Electron Spectroscopy and Related Phenomena, XXX (2018), XXX-XXX.

  69. P. Schattschneider, S. Löffler, M. Stöger-Pollach, J. Verbeeck:
    "Is magnetic chiral dichroism feasible with electron vortices?";
    Ultramicroscopy, 136 (2014), S. 81 - 85.

    Zusätzliche Informationen

  70. P. Schattschneider, S. Löffler, J. Verbeeck:
    "Comment on 'Quantized Angular Momentum Transfer and Magnetic Dichroism in the Interaction of Electron Vortices with Matter'";
    Physical Review Letters, PRL 110 (2013), S. 189501-1 - 189501-2.

    Zusätzliche Informationen

  71. P. Schattschneider, John Rehr, Leslie Allen:
    "Comment on "Electromagnetic Vortex Fields, Spin, and Spin-Orbit Interactions in Electron Vortices"";
    Physical Review Letters, 113 (2014), S. 029501.

  72. P. Schattschneider, St. Rubino, C. Hébert, J. Rusz, J. Kunes, P. Novák, E. Carlino, M. Fabrizioli, G. Panaccione, G. Rossi:
    "Detection of magnetic circular dichroism using a transmission electron microscope";
    Nature, 441 (2006), S. 486 - 488.

    Zusätzliche Informationen

  73. P. Schattschneider, St. Rubino, M. Stöger-Pollach, C. Hébert, J. Rusz, L. Calmels, E. Snoeck:
    "Energy loss magnetic chiral dichroism: A new technique for the study of magnetic properties in the electron microscope";
    Journal of Applied Physics (eingeladen), 103 (2008), S. 07D931-1 - 07D931-6.

  74. P. Schattschneider, T. Schachinger, M. Stöger-Pollach, S. Löffler, A. Steiger-Thirsfeld, K. Bliokh, F. Nori:
    "Imaging the dynamics of free-electron Landau states";
    Nature Communications, 5 (2014), S. 1 - 6.

    Zusätzliche Informationen

  75. P. Schattschneider, T. Schachinger, J. Verbeeck:
    "Transmissions-Elektronenmikroskopie mit Elektronenwirbeln Ein Whirlpool aus Elektronen";
    Physik Unserer Zeit, 1 (2018), 49; S. 22 - 28.

  76. P. Schattschneider, B. Schaffer, I. Ennen, J. Verbeeck:
    "Mapping spin-polarized transitions with atomic resolution";
    Physical Review B, 85 (2012), 13; S. 134422 - 134429.

    Zusätzliche Informationen

  77. P. Schattschneider, M. Stöger-Pollach, C. Hébert, B. Jouffrey:
    "The Separation of Surface and Bulk Contributions in ELNES Spectra";
    Ultramicroscopy, 93 (2002), S. 91 - 97.

  78. P. Schattschneider, M. Stöger-Pollach, S. Löffler, A. Steiger-Thirsfeld, J. Hell, J. Verbeeck:
    "Sub-nanometer free electrons with topological charge";
    Ultramicroscopy, 115 (2012), S. 21 - 25.

    Zusätzliche Informationen

  79. P. Schattschneider, M. Stöger-Pollach, St. Rubino, M. Sperl, C. Hurm, J. Zweck, J. Rusz:
    "Detection of magnetic circular dichroism on the two-nanometer scale";
    Physical Review B, 78 (2008), S. 104413-1 - 104413-5.

    Zusätzliche Informationen

  80. P. Schattschneider, M. Stöger-Pollach, J. Verbeeck:
    "Novel Vortex Generator and Mode Converter for Electron Beams";
    Physical Review Letters, 109 (2012), 8; S. 084801-1.

    Zusätzliche Informationen

  81. P. Schattschneider, J. Verbeeck:
    "Fringe contrast in inelastic LACBED holography";
    Ultramicroscopy, 108 (2008), S. 407 - 414.

    Zusätzliche Informationen

  82. P. Schattschneider, J. Verbeeck:
    "Theory of free electron vortices";
    Ultramicroscopy, 111 (2011), 9-10; S. 1461 - 1468.

    Zusätzliche Informationen

  83. P. Schattschneider, J. Verbeeck, A.L. Hamon:
    "Real space maps of atomic transitions";
    Ultramicroscopy, 109 (2009), S. 781 - 787.

    Zusätzliche Informationen

  84. P. Schattschneider, J. Verbeeck, V. Mauchamp, M. Jaouen:
    "Real-space simulations of spin-polarized electronic transitions in iron";
    Physical Review B, 82 (2010), 14; S. 1 - 11.

    Zusätzliche Informationen

  85. P. Schattschneider, W.S.M. Werner:
    "Coherence in electron energy loss spectrometry";
    Journal of Electron Spectroscopy and Related Phenomena, 143 (2005), S. 81 - 95.

    Zusätzliche Informationen

  86. S. Schneider, D. Pohl, S. Löffler, D. Kasinathan, J. Rusz, P. Schattschneider, L. Schultz, B. Rellinghaus:
    "Quantifying Magnetism on the nm Scale: EMCD on Individual FePt Nanoparticles";
    Microscopy and Microanalysis, 22 (2016), 3; S. 1674 - 1675.

  87. S. Schneider, D. Pohl, S. Löffler, J. Rusz, D. Kasinathan, P. Schattschneider, L. Schultz, B. Rellinghaus:
    "Magnetic properties of single nanomagnets: Electron energy-loss magnetic chiral dichroism on FePt nanoparticles";
    Ultramicroscopy, 171 (2016), S. 186 - 194.

    Zusätzliche Informationen

  88. V. Serin, F. Houdellier, B. Warot-Fonrose, L. Calmels, M. Stöger-Pollach, C. Hébert, St. Rubino, P. Schattschneider, J. Rusz, P. Novak, M. Hytch, E. Snoeck:
    "State of the art in energy loss magnetic chiral dichroism (EMCD)";
    Microscopy and Microanalysis, 13 (2007), 2; S. 1286 CD - 1287 CD.

  89. M. Stöger-Pollach, H. Franco, P. Schattschneider, S. Lazar, B. Schaffer, W. Grogger, H. Zandbergen:
    "Cerenkov losses: A limit for bandgap determination and Kramers-Kronig analysis";
    Micron, 37 (2006), 5; S. 396 - 402.

    Zusätzliche Informationen

  90. M. Stöger-Pollach, H. Franco, P. Schattschneider, S. Lazar, B. Schaffer, W. Grogger, H.W. Zandbergen:
    "Cerenkov losses: A limit for bandgap determination and Kramers-Kronig analysis";
    Micron, 37 (2006), 5; S. 396 - 402.

    Zusätzliche Informationen

  91. M. Stöger-Pollach, C. Hébert, H.W. Zandbergen, P. Schattschneider:
    "Thickness dependent loss function of Si with 0.14 eV energy resolution";
    Advanced Engineering Materials, 6 (2004), No. 10; S. 826 - 828.

    Zusätzliche Informationen

  92. M. Stöger-Pollach, A. Laister, P. Schattschneider:
    "Treating retardation effects in valence EELS spectra for Kramers-Kronig analysis";
    Ultramicroscopy, 108 (2008), S. 439 - 444.

    Zusätzliche Informationen

  93. M. Stöger-Pollach, P. Schattschneider:
    "The influence of relativistic energy losses on bandgap determination using valence EELS";
    Ultramicroscopy, 107 (2007), S. 1178 - 1185.

    Zusätzliche Informationen

  94. M. Stöger-Pollach, P. Schattschneider:
    "The influence of relativistic energy losses on bandgap determination using valence EELS";
    Ultramicroscopy, 107 (2007), 12; S. 1178 - 1185.

    Zusätzliche Informationen

  95. M. Stöger-Pollach, P. Schattschneider, L.Y. Wei, B. Jouffrey, C. Eisenmenger-Sittner:
    "Separation of pure elemental and oxygen influenced signal in ELNES";
    Ultramicroscopy, 92 (2002), S. 285 - 292.

    Zusätzliche Informationen

  96. M. Stöger-Pollach, T. Walter, M. Muske, S. Gall, P. Schattschneider:
    "Phase transformations of an alumina membrane and its influence on silicon nucleation during the aluminium induced layer exchange";
    Thin Solid Films, 515 (2007), 7-8; S. 3740 - 3744.

    Zusätzliche Informationen

  97. M. Stöger-Pollach, T. Walter, M. Muske, S. Gall, P. Schattschneider:
    "Phase transformations of an alumina membrane and its influence on silicon nucleation during the aluminium induced layer exchange";
    Thin Solid Films, 515 (2007), S. 3740 - 3744.

  98. F. Tian, P. Schattschneider, M. Stöger-Pollach:
    "Retraction notice to "The post-peak spectra in electron energy loss near edge structure"";
    Ultramicroscopy, 147 (2014), S. 164.

  99. F. Tian, P. Schattschneider, M. Stöger-Pollach:
    "The post-peak spectra in electron energy loss near edge structure";
    Ultramicroscopy, 136 (2014), 136; S. 160 - 164.

    Zusätzliche Informationen

  100. N. Vast, L. Reining, V. Olevano, P. Schattschneider, B. Jouffrey:
    "Local Field Effects in the Electron Energy Loss Spectra of Rutile TiO2";
    Physical Review Letters, Vol. 88 (2002), Nr. 3; S. 037601-1 - 037601-4.

  101. J. Verbeeck, G. Bertoni, P. Schattschneider:
    "The Fresnel effect of a defocused biprism on the fringes in inelastic holography";
    Ultramicroscopy, 108 (2008), S. 263 - 269.

    Zusätzliche Informationen

  102. J. Verbeeck, C. Hébert, St. Rubino, P. Novák, J. Rusz, F. Houdellier, C. Gatel, P. Schattschneider:
    "Optimal aperture sizes and positions for EMCD experiments";
    Ultramicroscopy, 108 (2008), S. 865 - 872.

    Zusätzliche Informationen

  103. J. Verbeeck, P. Schattschneider, S. Lazar, M. Stöger-Pollach, S. Löffler, A. Steiger-Thirsfeld, G. Van Tendeloo:
    "Atomic scale electron vortices for nanoresearch";
    Applied Physics Letters, 99 (2011), S. 203109-1 - 203109-3.

    Zusätzliche Informationen

  104. J. Verbeeck, P. Schattschneider, A. Rosenauer:
    "Image simulation of high resolution energy filtered TEM images";
    Ultramicroscopy, 109 (2009), S. 350 - 360.

    Zusätzliche Informationen

  105. J. Verbeeck, H. Tian, P. Schattschneider:
    "Production and application of electron vortex beams";
    Nature, 467 (2010), S. 301 - 304.

    Zusätzliche Informationen

  106. J. Verbeeck, D. Van Dyck, H. Lichte, P. Potapov, P. Schattschneider:
    "Plasmon holographic experiments: theoretical framework";
    Ultramicroscopy, 102 (2005), 3; S. 239 - 255.

    Zusätzliche Informationen

  107. Y. Wang, H. Li, C. Yu, G. Wu, I. Gordon, P. Schattschneider, O. Van Der Biest:
    "Antimony Induced Crystallization of Amorphous Silicon";
    Acta Metallurgica Sinica (English Letters), 20 (2007), 3; S. 167 - 170.

    Zusätzliche Informationen

  108. B. Warot-Fonrose, C. Gatel, L. Calmels, V. Serin, P. Schattschneider:
    "Effect of spatial and energy distortions on energy-loss magnetic chiral dichroism measurements: Application to an iron thin film";
    Ultramicroscopy, 110 (2010), 8; S. 1033 - 1037.

    Zusätzliche Informationen

  109. W.S.M. Werner, P. Schattschneider:
    "On the energy dissipation process in incoherent electron scattering";
    Journal of Electron Spectroscopy and Related Phenomena, 143 (2005), S. 65 - 80.

    Zusätzliche Informationen

  110. A. Wolff, K. Frese, M. Wißbrock, K. Eckstädt, I. Ennen, W. Hetaba, S. Löffler, A. Regtmeier, P. Thomas, N. Sewald, P. Schattschneider, A. Hütten:
    "Influence of the synthetic polypeptide c25-mms6 on cobalt ferrite nanoparticle formation";
    Journal of Nanoparticle Research, 14 (2012), 10; S. 1161.

  111. A. Wolff, W. Hetaba, M. Wißbrock, S. Löffler, N. Mill, K. Eckstädt, A. Dreyer, I. Ennen, N. Sewald, P. Schattschneider, A. Hütten:
    "Oriented attachment explains cobalt ferrite nanoparticle growth in bioinspired syntheses";
    Beilstein Journal of Nanotechnology, 5 (2014), S. 210 - 218.

    Zusätzliche Informationen

  112. L. Zhang, D. Li, J. Mu, Haiyong Chen, Lixue Chen, H. Yang, C. Gao, P. Schattschneider:
    "Two routes of forming nanorods on the base of nanoparticles";
    Journal of Crystal Growth, 314 (2011), S. 227 - 230.

    Zusätzliche Informationen


Buchbeiträge


  1. C. Hébert, J. Le Bossé, G. A. Botton, P. Schattschneider:
    "Anisotropy in Electron Energy Loss Spectrometry";
    in: "Linear and Chiral Dichroism in the Electron Microscope", herausgegeben von: Peter Schattschneider; Pan Stanford Publishing Pte.Ltd., Singapore, 2012, ISBN: 978-981-4267-48-9, S. 1 - 22.

  2. B. Jouffrey, P. Schattschneider, C. Hébert:
    "Ionization Edges: Some Underlying Physics and Their Use in Electron Microscopy";
    in: "Advances in Imaging and Electron Physics Vol. 123", P. Hawkes et al. (Hrg.); herausgegeben von: Academic Press; Elsevier, 2002, ISBN: 0120147653, S. 413 - 450.

  3. S. Rubino, H. Lidbaum, J. Rusz, K. Leifer, B. Warot-Fonrose, V. Serin, M. Stöger-Pollach, P. Schattschneider:
    "EMCD Techniques";
    in: "Linear and Chiral Dichroism in the Electron Microscope", herausgegeben von: Peter Schattschneider; Pan Stanford Publishing Pte.Ltd., Singapore, 2012, ISBN: 978-981-4267-48-9, S. 149 - 173.

  4. P. Schattschneider:
    "Chirality in Electron Energy Loss Spectrometry";
    in: "Linear and Chiral Dichroism in the Electron Microscope", herausgegeben von: Peter Schattschneider; Pan Stanford Publishing Pte.Ltd., Singapore, 2012, ISBN: 978-981-4267-48-9, S. 43 - 64.

  5. P. Schattschneider, T. Reger:
    "Of Cats, Quanta and Cephalopods";
    in: "Mystery +rosebud no. 5", Rosebud, Inc. and Die Gestalten Verlag GmbH & Co. KG, Berlin, 2004, ISBN: 3-89955-037-4, S. 26 - 49.

  6. P. Schattschneider, J. Verbeeck, M. Stöger-Pollach:
    "Prospects for Spin Mapping with Atomic Resolution";
    in: "Linear and Chiral Dichroism in the Electron Microscope", herausgegeben von: Peter Schattschneider; Pan Stanford Publishing Pte.Ltd., Singapore, 2012, ISBN: 978-981-4267-48-9, S. 243 - 255.

  7. M. Stöger-Pollach, J. Verbeeck, P. Schattschneider:
    "EMCD on the Nanometre Scale";
    in: "Linear and Chiral Dichroism in the Electron Microscope", herausgegeben von: Peter Schattschneider; Pan Stanford Publishing Pte.Ltd., Singapore, 2012, ISBN: 978-981-4267-48-9, S. 213 - 223.


Beiträge in Tagungsbänden


  1. G. Beaucarne, D. Van Gestel, I. Gordon, L. Carnel, K. Van Nieuwenhuysen, C. Ornaghi, J. Poortmans, M. Stöger-Pollach, P. Schattschneider:
    "Aluminium-Induced Crystallization of silicon on High Temperature Substrates for Thin-Film Crystalline Silicon Solar Cells";
    in: "Nineteenth European Photovoltaic Solar Energy Conference", D. Hoffmann, J.L. Bal, H. Ossenbeck, W. Palz, P. Helm (Hrg.); Grafica Lito, Florence, Italien, 2004, ISBN: 3-936-338-14-0, S. 467 - 470.

  2. T. Galek, C. Hébert, T. Moskalewicz, H. Figiel, P. Schattschneider:
    "Plasmon spectroscopy of pure and hydrogenated GdMn2, ErMn2 and TbMn2";
    in: "International Symposium on Metal-hydrogen systems fundamentals and applications", H. Figiel, P. Mietniowski, A. Paja (Hrg.); CCNS, Kraków, Polen, 2004, ISBN: 83-921064-0-7, S. 155.

  3. S. Gall, J. Schneider, J. Klein, M. Muske, B. Rau, E. Conrad, I. Sieber, W. Fuhs, C. Ornaghi, D. Van Gestel, I. Gordon, K. Van Nieuwenhuysen, G. Beaucarne, J. Poortmans, M. Stöger-Pollach, J. Bernardi, P. Schattschneider, Y. Wang, O. Van Der Biest:
    "Crystalline Silicon Thin-Film solar cells on foreign substrates: The European Project Meteor";
    in: "Nineteenth European Photovoltaic Solar Energy Conference", D. Hoffmann, J.L. Bal, H. Ossenbeck, W. Palz, P. Helm (Hrg.); Grafica Lito, Florence, Italien, 2004, ISBN: 3-936-338-14-0, S. 475 - 478.

  4. C. Hébert, C. Eisenmenger-Sittner, P. Schattschneider:
    "Application of the Virtual Crystal Approximation to Elnes Calculations: The Cu L3 Edge in Cuni Alloys";
    in: "6th Multinational Congress on Microscopy - European Extension", O. Milat, D. Jezek (Hrg.); Croatian Society for Electron Mircoscopy, Zagreb, Croatia, 2003, ISBN: 953-99339-0-0, S. 398 - 399.

  5. C. Hébert, J. Luitz, P. Schattschneider:
    "The Cu L3 Edge in Cu-Ni Alloys: Comparison between the VCA and Supercell Calculations";
    in: "Proc.15th International Congress of Electron Microscopy", Microscopy Society, South Africa, 2002, ISBN: 0-620-29294-6, S. 149 - 150.

  6. C. Hébert, P. Schattschneider, B. Jouffrey:
    "Magic Angle: an unsolved mystery";
    in: "13th European Microscopy Congress EMC 2004", D. Schryvers, J.P. Timmermans (Hrg.); Print-it, Herentals, Belgien, 2004, S. 265 - 266.

  7. C. Hébert, P. Schattschneider, J. Luitz, C. Ambrosch-Draxl:
    "Core loss spectroscopies - a comparison between ELNES and XANES";
    in: "Proceedings of International Seminar on Photoionzation in Atom", Y. Azuma, Y. Ito et al. (Hrg.); Kyoto University Press, Kyoto, Japan, 2002, S. 45 - 50.

  8. C. Hébert, P. Schattschneider, M. Stöger-Pollach, D.S. Su:
    "Core Holes, Low-Lying Edges and Elnes: Subtle Details of Wien97";
    in: "Proc.15th International Congress on Electron Microscopy", Microscopy Society, South Africa, 2002, ISBN: 0-620-29294-6, S. 151 - 152.

  9. F. Houdellier, B. Warot-Fonrose, M.J. Hytch, E. Snoeck, L. Calmels, V. Serin, P. Schattschneider:
    "Dichroisme circulaire magnétique EMCD (Electron Energy Loss Magnetic Chiral Dichroism) dans un micorscope électronique en transmission équipé d´un correcteur d´aberration sphérique";
    in: "Organisé en collaboration avec le GN-MEBA et le Cercle Francais de Pathologie Ultrastructurale", Société Francaise des Microscopies, Grenoble, 2007, S. 96.

  10. B. Jouffrey, P. Schattschneider, C. Hébert:
    "Inelastic Events: Some Physics behind and their use in Electron Microscopy";
    in: "Proceedings of 5th Multinational Congress on Electron Microscopy", L. Dini, M. Catalano (Hrg.); Rinton Press, New Jersey, USA, 2002, (eingeladen), ISBN: 1-58949-003-7, S. 15 - 20.

  11. H. Lichte, P. Potapov, D. Van Dyck, P. Schattschneider:
    "Coherence in a Plasmon-Scattered Wavefield";
    in: "Proceedings Microscopy Conference MC 2003", T. Gemming, M. Lehmann, H. Lichte, K. Wetzig (Hrg.); Cambridge University Press, Cambridge, Großbritanien, 2003, S. 84 - 85.

  12. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider:
    "Energy-loss magnetic chiral dichroism - Investigating magnetism on the nanometer scale";
    in: "Proceedings of the Junior Scientist Conference", Technische Universität Wien, 2010, ISBN: 978-3-200-01797-9, S. 173 - 174.

  13. P. Potapov, H. Lichte, J. Verbeeck, D. Van Dyck, P. Schattschneider:
    "Point-to-point cohernece in inelastic scattering";
    in: "13th European Microscopy Congress EMC 2004", D. Schryvers, J.P. Timmermans (Hrg.); Print-it, Herentals, Belgien, 2004, S. 191 - 192.

  14. B. Rau, J. Schneider, M. Muske, I. Sieber, S. Gall, M. Stöger-Pollach, P. Schattschneider, W. Fuhs:
    "Epitaxial Si Growth on Polycrystalline Si seed layers at Low Temperature";
    in: "Nineteenth European Photovoltaic Solar Energy Conference", W. Hoffmann, J.L. Bal, H. Ossenbeck, W. Palz, P. Helm (Hrg.); Grafica Lito, Florence, Italien, 2004, ISBN: 3-936-338-14-0, S. 1131 - 1134.

  15. B. Rau, B. Selle, U. Knipper, S. Brehme, I. Sieber, M. Stöger-Pollach, P. Schattschneider, S. Gall, W. Fuhs:
    "Low-Temperature Epitaxial Si Absorber Layers Grown by Electron-Cyclotron Resonance Chemical Vapor Deposition";
    in: "Proceedings of 3rd World Conference on Photovoltaic Energy Conversioin", K. Kurokawa, Ll.L. Kazmerski, B. McNelis, M. Yamaguchi, C. Wronski, W.C. Sinke (Hrg.); Arisumi Printing Inc., Japan, 2003, ISBN: 4-9901816-0-3, S. 1237 - 1240.

  16. St. Rubino, C. Hébert, M. Stöger-Pollach, P. Schattschneider, C. Prioul, A. Phelippeau:
    "Lattice site dependence of carbon K-ELNES in steel";
    in: "13th European Microscopy Congress EMC 2004", D. Schryvers, J.P. Timmermans (Hrg.); Print-it, Herentals, Belgien, 2004, S. 737 - 738.

  17. St. Rubino, P. Schattschneider, C. Hébert:
    "TEM experiments on Circular Dichroism in Nickel";
    in: "13th European Microscopy Congress EMC 2004", D. Schryvers, J.P. Timmermans (Hrg.); Print-it, Herentals, Belgien, 2004, S. 313 - 314.

  18. St. Rubino, M. Stöger-Pollach, C. Hébert, P. Schattschneider, J. Rusz, P. Novák:
    "Energy Loss Magnetic Chiral Dichroism: theory and experiments";
    in: "Verhandlungen der Deutschen Physikalischen Gesellschaft", Section Metal and Material Physics (MM), Regensburg, 2007, ISSN: 0420-0195, S. 521.

  19. P. Schattschneider:
    "A new technique for the study of magnetic properties in the electron microscope";
    in: "52nd Annual Conference on Magnetism and Magnetic Materials", Chairman, Florida, 2007, S. 77.

  20. P. Schattschneider:
    "Localisation and Correlation in Low Energy Losses";
    in: "6th Multinational Congress on Microscopy - European Extension", O. Milat, D. Jezek (Hrg.); Croatian Society for Electron Mircoscopy, Zagreb, Croatia, 2003, ISBN: 953-99339-0-0, S. 396 - 397.

  21. P. Schattschneider, E. Carlino, H. Lichte, P. Novák, J. Zweck, C. Hébert, J. Bernardi:
    "CHIRALTEM - circular dichroism in the TEM";
    in: "13th European Microscopy Congress EMC 2004", D. Schryvers, J.P. Timmermans (Hrg.); Print-it, Herentals, Belgien, 2004, S. 381 - 382.

  22. P. Schattschneider, B. Jouffrey:
    "Energy Loss Spectrometry and Eftem - The Present Situation and Things to come";
    in: "6th Multinational Congress on Microscopy", O. Milat, D. Jezek (Hrg.); Croatian Society for Electron Mircoscopy, Zagreb, Croatia, 2003, (eingeladen), ISBN: 953-99339-0-0, S. 63 - 64.

  23. P. Schattschneider, B. Jouffrey:
    "Experimental Evidence for a Localized Collective Mode";
    in: "Proc.15th International Congress on Electron Microscopy", Microscopy Society, South Africa, 2002, ISBN: 0-620-29294-6, S. 283 - 284.

  24. P. Schattschneider, B. Jouffrey, N. Vast, L. Reining:
    "Plasmon Dispersion in Rutile";
    in: "Proc.15th International Congress on Electron Microscopy", Microscopy Society, South Africa, 2002, ISBN: 0-620-29294-6, S. 161 - 162.

  25. P. Schattschneider, St. Rubino, C. Hébert:
    "Observation of Circular Dichroism in the TEM";
    in: "Microscopy and Microanalysis,", I.M. Andersen, R. Price, E. Hall, E. Clark, S. McKernan (Hrg.); Cambridge University Press, 2004, S. 836 - 837.

  26. P. Schattschneider, M. Stöger-Pollach:
    "Observation of metal induced gap states at a-Si/Al and c-Si/Al interfaces";
    in: "Microscopy and Microanalysis,", I.M. Andersen, R. Price, E. Hall, E. Clark, S. McKernan (Hrg.); Cambridge University Press, 2004, S. 856 - 857.

  27. M. Stöger-Pollach, A. Breymesser, P. Schattschneider, V. Schlosser:
    "Investigation of impurity enrichment and electronic properties of microcrystalline silicon thin films";
    in: "Microscopy of Semiconducting Materials ", A.G. Cullis, J.L. Hutchison (Hrg.); herausgegeben von: Institute of Physics, Conference Series Number 169; Bookcraft, Midsomer Norton, 2001, ISBN: 0-7503-0818-4, S. 391 - 394.

  28. M. Stöger-Pollach, C. Hébert, E.C. Karl-Rückert, P. Schattschneider, B. Rau, S. Gall, H.W. Zandbergen:
    "Investigation of core level states in epitaxial grown Si layers by electron energy loss spectrometry";
    in: "Microscopy of Semiconducting Materials 2003", A.G. Cullis, P.A. Midgley (Hrg.); Institute of Physics Publishing, Bristol and Philadelphia, 2004, ISBN: 075030979-2, S. 37 - 40.

  29. M. Stöger-Pollach, C. Hébert, P. Schattschneider, H.W. Zandbergen, B. Rau, S. Gall:
    "SUB-eV Core Level Shifts in Si Grain Boundaries and Nanotwins";
    in: "6th Multinational Congress on Microscopy - European Extension", Croatian Society for Electron Mircoscopy, Zagreb, Croatia, 2003, ISBN: 953-99339-0-0, S. 171 - 172.

  30. M. Stöger-Pollach, P. Schattschneider:
    "Elnes Separation on Cr L2,3-Edges Influenced by Oxygen";
    in: "Proc.15th International Congress on Electron Microscopy", Microscopy Society, South Africa, 2002, ISBN: 0-620-29294-6, S. 851 - 852.

  31. M. Stöger-Pollach, P. Schattschneider:
    "Metal induced gap states at a c-Si/Al Schottky barrier";
    in: "13th European Microscopy Congress EMC 2004", D. Schryvers, J.P. Timmermans (Hrg.); Print-it, Herentals, Belgien, 2004, S. 47 - 48.

  32. M. Stöger-Pollach, P. Schattschneider, C. Hébert, H.W. Zandbergen:
    "Unexplained Thickness Dependence in the Si Loss Function at 0.14 eV Energy Resolution";
    in: "6th Multinational Congress on Microscopy - European Extension", O. Milat, D. Jezek (Hrg.); Croatian Society for Electron Mircoscopy, Zagreb, Croatia, 2003, ISBN: 953-99339-0-0, S. 400 - 401.

  33. M. Stöger-Pollach, P. Schattschneider, J. Schneider, S. Gall:
    "The Elnes Separation Applied to Oxidation states of Interfaces";
    in: "6th Multinational Congress on Microscopy - European Extension", O. Milat, D. Jezek (Hrg.); Croatian Society for Electron Mircoscopy, Zagreb, Croatia, 2003, ISBN: 953-99339-0-0, S. 169 - 170.

  34. M. Stöger-Pollach, P. Schattschneider, J. Schneider, S. Gall, H.W. Zandbergen:
    "Investigations of bonding at an aluminium (III) oxide membrane in Si using ELNES separation";
    in: "Microscopy of Semiconducting Materials 2003", A.G. Cullis, P.A. Midgley (Hrg.); Institute of Physics Publishing, Bristol and Philadelphia, 2004, ISBN: 075030979-2, S. 401 - 404.


Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag)


  1. M. Bugnet, G. Radtke, S. Löffler, P. Schattschneider, D. Hawthorn, H. Dabkowska, G. Luke, G. Sawatzky, G. A. Botton:
    "Quantifying the hole distribution in cuprates: Atomic-resolution near-edge fine-structures of the superconductor Sr3Ca11Cu24O41";
    Vortrag: The 16th European Microscopy Congress, Lyon, France; 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  2. M. Bugnet, G. Radtke, S. Löffler, P. Schattschneider, D. Hawthorn, G. Sawatzky, G. A. Botton:
    "Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors";
    Vortrag: Microscopy and Microanalysis 2015 Meeting, Portland, Oregon, USA; 02.08.2015 - 06.08.2015; in: "Proceedings of Microscopy & Microanalysis 2015", Microscopy and Microanalysis, 21 (Suppl 3) (2015), ISSN: 1431-9276; S. 665 - 666.

  3. L. Calmels, B. Warot, F. Houdellier, P. Schattschneider, C. Gatel, V. Serin, E. Snoeck:
    "Orbital and spin sum rules for electron energy loss magnetic chiral dichroism: Application to metals and oxides";
    Vortrag: 14th European Microscopy Congress EMC 2008, Aachen, Germany; 01.09.2008 - 05.09.2008; in: "EMC 2008", Springer-Verlag, 1 / Berlin Heidelberg (2008), ISBN: 978-3-540-85154-7; S. 359 - 360.

  4. B. Einenkel, P. Formanek, C. Hébert, C. Hurm, H. Lichte, St. Rubino, P. Schattschneider, J. Zweck:
    "Instrumental Developments for the ChiralTEM Project";
    Vortrag: IMC'16 The 16th International Microscopy Congress, Sapporo, Japan; 03.09.2006 - 08.09.2006; in: "Microscopy for the 21st Century -- Contribution to Life and Materials Science", (2006), S. 1137.

  5. I. Ennen, S. Löffler, W. Hetaba, M. Stöger-Pollach, P. Schattschneider, A. Auge, A. Hütten:
    "Magnetic dichroism on the nanoscale";
    Poster: MC 2011 Kiel, Kiel, Deutschland; 28.08.2011 - 02.09.2011; in: "Proceedings of the MC 2011 Kiel", Volume 1: Instrumentation and Methods (2011), ISBN: 978-3-00-033910-3; S. IM5.P164.

  6. I. Ennen, S. Löffler, M. Stöger-Pollach, A. Hütten, P. Schattschneider:
    "Magnetic dichroism in the TEM: a tool for the investigation of magnetism on the nanoscale";
    Vortrag: 10th Multinational Congress on Microscopy 2011, Urbino University, Italy; 04.09.2011 - 09.09.2011; in: "MCM 2011", (2011), 2 S.

  7. I. Ennen, M. Stöger-Pollach, P. Schattschneider, J. Verbeeck, P. Nellist:
    "Chirality in EELS: Progress and Applications";
    Vortrag: Microscopy Conference Graz, Dreiländertagung, Graz; 30.08.2009 - 04.09.2009; in: "MC Graz 2009", Facultas Verlag, (2009), ISBN: 978-3-85125-062-6; 2 S.

  8. I. Ennen, M. Stöger-Pollach, P. Schattschneider, J. Verbeeck, P. Nellist:
    "Chiralty in EELS: Progress and Applications";
    Vortrag: Microscopy Conference 2009, Graz; 30.08.2009 - 04.09.2009; in: "MC 2009 Graz", W. Grogger, F. Hofer, P. Pölt (Hrg.); Facultas Verlag, Volume 3 / Wien (2009), ISBN: 978-3-85125-062-6; S. 119 - 120.

    Zusätzliche Informationen

  9. D. Eyidi, C. Hébert, P. Schattschneider:
    "Is parallel illumination possible in the TEM?";
    Poster: 55. Jahrestagung der österreichischen physikalischen Gesellschaft 2005, Vienna University of Technology, Austria; 27.09.2005 - 29.09.2005; in: "55. Jahrestagung der österreichischen physikalischen Gesellschaft", ÖPG, (2005), S. P-FKP40.

  10. Z. Feng, S. Löffler, D. Su, P. Schattschneider:
    "Determination the position of the Compton scattering in energy loss spectroscopy";
    Poster: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9.

  11. T. Galek, C. Hébert, P. Schattschneider:
    "Data Processing in Valence Electron Energy Loss Spectroscopy";
    Poster: ACMM (19) - Australian Conference on Microscopy and Microanalysis, Sydney, Australien; 05.02.2006 - 09.02.2006; in: "ACMM (19) - Program & Abstracts", Abstract 130 (2006), ISBN: 0-9580408-4-2; S. 1.

  12. T. Galek, C. Hébert, M. Stöger-Pollach, P. Schattschneider:
    "Metal Induced Gap States at Si / Al Interface";
    Poster: JEELS 06, Château Royal de Blois, France; 15.05.2006 - 17.05.2006; in: "JEELS 06 - Cinquième "journées de spectroscopie de pertes d'énergie des élecrons"", (2006), S. 1.

  13. T. Galek, C. Hébert, M. Stöger-Pollach, P. Schattschneider:
    "Numerical Aspects of Valence Electron Energy Loss Spectrometry";
    Poster: Microscopy and Microanalysis, Chicago, Illinois, USA; 30.07.2006 - 03.08.2006; in: "Microscopy and Microanalysis", 12 (2006), ISSN: 1431-9276; S. 1180 CD - 1181 CD.

  14. T. Galek, M. Stöger-Pollach, C. Hébert, P. Schattschneider:
    "Ab initio study of metal induced gap states at Si / Al interface";
    Poster: DFTEM 2006 - International Conference on Density Functional Theory and Transmission Electron Microscopy, Vienna, Austria; 21.04.2006 - 23.04.2006; in: "DFTEM 2006 - bringing together two communities", J. Luitz et al. (Hrg.); (2006), ISBN: 3-902548-00-2; S. 199 - 202.

  15. T. Galek, M. Stöger-Pollach, C. Hébert, P. Schattschneider:
    "Data processing in valence electron energy loss spectroscopy";
    Poster: Australian Conference on Microscopy and Microanalysis, Sydney, Australia; 05.02.2006 - 09.02.2006; in: "ACMM (19)", (2006).

  16. T. Galek, M. Stöger-Pollach, C. Hébert, P. Schattschneider:
    "Kramers-Kronig Analysis and Data Processing in VEELS";
    Poster: JEELS 06, Château Royal de Blois, France; 15.05.2006 - 17.05.2006; in: "JEELS 06 - Cinquième "journées de spectroscopie de pertes d'énergie des élecrons"", (2006), S. 1.

  17. T. Galek, M. Stöger-Pollach, A. Laister, C. Hébert, P. Schattschneider:
    "Kramers-Kronig Analysis in the Valence Electron Energy Loss Spectrometry";
    Poster: 5. Workshop on Electron Energy Loss Spectrometry and Energy Filtering, Vienna, Austria; 27.09.2006 - 29.09.2006; in: "AK EELS-EFTEM; 5. Workshop on Electron Loss Spectrometry and Engergy Filtering", J. Luitz et al. (Hrg.); Editio Amici - Physicae et chimicae solidorum amici, (2006), ISBN: 978-3-902548-01-6; S. 1.

  18. T. Galek, M. Stöger-Pollach, A. Laister, C. Hébert, P. Schattschneider:
    "Kramers-Kronig analysis in the valence electron energy loss spectrometry";
    Poster: AK EELS-EFTEM, Vienna University of Technology, Austria; 27.09.2006 - 29.09.2006; in: "5th Workshop on Electron Energy Loss Spectrometry and Energy Filtering", (2006).

  19. S. Gall, J. Schneider, J. Klein, M. Muske, B. Rau, E. Conrad, I. Sieber, W. Fuhs, D. Gestel, I. Gordon, K. Nieuwenhuysen, L. Carnel, G. Beaucarne, J. Poortmans, M. Stöger-Pollach, P. Schattschneider:
    "Large-Grained Polycrystalline Silicon Thin-Film Solar Cells Using AIC Seed Layers";
    Vortrag: 31st IEEE Photovoltaic Specialists Conference, Lake Buena Vista/ Florida, Lake Buena Vista/ Florida; 03.01.2005 - 07.01.2005; in: "Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference-2005", (2005), S. 869 - 872.

  20. S. Gall, J. Schneider, J. Klein, M. Muske, B. Rau, E. Conrad, I. Sieber, W. Fuhs, D. Van Gestel, I. Gordon, K. Van Nieuwenhuysen, L. Carnel, G. Beaucarne, J. Poortmans, M. Stöger-Pollach, P. Schattschneider:
    "Large-Grained Polycrystalline Silicon Thin-Film Solar Cells Using AIC Seed Layers";
    Vortrag: 31st IEEE Photovoltaic Specialists Conference, Lake Buena Vista/ Florida; 03.01.2005 - 07.01.2005; in: "Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference-2005", (2005), ISBN: 0-7803-8707-4; S. 975 - 978.

  21. S. Gall, J. Schneider, J. Klein, M. Muske, B. Rau, E. Conrad, I. Sieber, W. Fuhs, D. Van Gestel, I. Gordon, K. Van Nieuwenhuysen, L. Carnel, J. Irigoyen, G. Beaucarne, J. Poortmans, M. Stöger-Pollach, P. Schattschneider, Y. Wang, O. Van Der Biest:
    "Development of Polycrystalline Silicon Thin-Film Solar Cells within the European Project Meteor";
    Poster: 20th European Photovoltaic Solar Energy Conference, Barcelona/ Spanien; 06.06.2005 - 10.06.2005; in: "Proceedings of the International Conference", (2005), S. 869 - 872.

  22. C. Gatel, B. Warot-Fonrose, F. Houdellier, P. Schattschneider:
    "Distortion corrections of ESI data cubes for magnetic studies";
    Vortrag: 14th European Microscopy Congress EMC 2008, Aachen, Germany; 01.09.2008 - 05.09.2008; in: "EMC 2008", Springer-Verlag, 1 / Berlin Heidelberg (2008), ISBN: 978-3-540-85154-7; S. 377 - 378.

  23. V. Grillo, T. Schachinger, E. Karimi, P. Schattschneider:
    "Spin-multislice simulation of an electron inside the objective lens of a TEM";
    Poster: The 16th European Microscopy Congress, Lyon, France; 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  24. R. Hambach, J. Biskupek, S. Löffler, V. Motsch, P. Schattschneider, U. Kaiser:
    "Towards real-space mapping of valence states using core-loss EFTEM imaging";
    Poster: Microscopy Conference 2013, Universität Regensburg, BRD; 25.08.2013 - 30.08.2013; in: "MC2013 Proceedings Part 1", (2013), S. 184 - 185.

  25. C. Hébert, St. Rubino, E. Carlino, P. Schattschneider, G. Rossi, M. Fabrizioli, F. Macherozzi:
    "Measurement of Magnetic Circular Dichroism at the Fe L23 edge in the Electron Microscope";
    Poster: Satellite workshop to SOLEIL Users Meeting, Paris, France; 16.01.2006 - 19.01.2006; in: "Colloque Magnétisme de soleil synchotron, Workshop Magnetism", (2006), S. 1.

  26. C. Hébert, St. Rubino, P. Schattschneider, C. Hurm, J. Zweck, E. Carlino, M. Fabrizioli, G. Panaccione, G. Rossi, J. Rusz, P. Novák, P. Formanek, H. Lichte:
    "CHIRALTEM: Circular Dichroism in the Transmission Electron Microscope";
    Vortrag: IMC'16 The 16th International Microscopy Congress, Sapporo, Japan (eingeladen); 03.09.2006 - 08.09.2006; in: "Microscopy for the 21st Century -- Contribution to Life and Materials Science", (2006), S. 826.

  27. C. Hébert, St. Rubino, P. Schattschneider, J. Rusz, P. Novák, C. Hurm, J. Zweck:
    "Observation of Magnetic Circular Dichroism in the Electron Microscope";
    Vortrag: Microscopy and Microanalysis, Chicago, Illinois, USA; 30.07.2006 - 03.08.2006; in: "Microscopy and Microanalysis", 12 (2006), ISSN: 1431-9276; S. 960 CD - 961 CD.

  28. C. Hébert, A. Satz, G. Kothleitner, C. Eisenmenger-Sittner, P. Schattschneider:
    "Lifetime of hot electronics in gold retrieved from loss EELS";
    Poster: 5. Workshop on Electron Energy Loss Spectrometry and Energy Filtering, Vienna, Austria; 27.09.2006 - 29.09.2006; in: "AK EELS-EFTEM; 5. Workshop on Electron Loss Spectrometry and Engergy Filtering", J. Luitz et al. (Hrg.); Editio Amici - Physicae et chimicae solidorum amici, (2006), ISBN: 978-3-902548-01-6; S. 1.

  29. C. Hébert, A. Satz, G. Kothleitner, C. Eisenmenger-Sittner, P. Schattschneider:
    "Lifetime of hot electrons in Au and Cu retrieved from low loss EELS";
    Poster: ACMM (19) - Australian Conference on Microscopy and Microanalysis, Sydney, Australien; 05.02.2006 - 09.02.2006; in: "ACMM (19) - Program & Abstracts", Abstract 129 (2006), ISBN: 0-9580408-4-2; S. 1.

  30. C. Hébert, A. Satz, G. Kothleitner, C. Eisenmenger-Sittner, P. Schattschneider:
    "Lifetime of hot electrons in metals retrived from low loss EELS";
    Vortrag: Microscopy and Microanalysis, Chicago, Illinois, USA; 30.07.2006 - 03.08.2006; in: "Microscopy and Microanalysis", 12 (2006), ISSN: 1431-9276; S. 1168 CD - 1169 CD.

  31. C. Hébert, M. Stöger-Pollach, A. Satz, T. Galek, P. Schattschneider:
    "New prospects for low energy loss spectrometry";
    Vortrag: 7th Multinational Congress on Microscopy, Portoroz/ Slowenien; 26.06.2005 - 30.06.2005; in: "MCM 2005", Josef Stefan Institute, (2005), ISBN: 961-6303-69-4; S. 55 - 58.

  32. W. Hetaba, S. Löffler, P. Schattschneider:
    "Site selective elemental analysis under electron channelling conditions";
    Poster: MC 2011 Kiel, Kiel, Deutschland; 28.08.2011 - 02.09.2011; in: "Proceedings of the MC 2011 Kiel", Volume 1: Instrumentation and Methods (2011), ISBN: 978-3-00-033910-3; S. IM5.P169.

  33. W. Hetaba, S. Löffler, P. Schattschneider:
    "Site specific elemental analysis using electron channelling";
    Poster: 10th Multinational Congress on Microscopy 2011, Urbino University, Italy; 04.09.2011 - 09.09.2011; in: "MCM 2011", (2011), S. 53 - 54.

  34. W. Hetaba, S. Löffler, P. Schattschneider:
    "Site-specific elemental analysis under electron channelling conditions";
    Vortrag: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9; S. 497 - 498.

  35. W. Hetaba, S. Löffler, M. Stöger-Pollach, A. Hütten, G. Parkinson, P. Schattschneider:
    "EMCD as a probe for magnetic phase transitions";
    Vortrag: Microscopy Conference 2015, Göttingen, Deutschland; 06.09.2015 - 11.09.2015; in: "Microscopy Conference 2015 Proceedings", DGE - German Society for Electron Microscopy, e.V., (2015), S. 535 - 537.

  36. W. Hetaba, S. Löffler, M. Stöger-Pollach, A. Hütten, G. Parkinson, P. Schattschneider:
    "Probing magnetic phase transitions using EMCD";
    Vortrag: 12th Multinational Congress on Microscopy, Eger, Ungarn; 23.08.2015 - 28.08.2015; in: "12th Multinational Congress on Microscopy", Hungarian Academy of Sciences, Eger, Ungarn (2015), S. 252 - 254.

  37. W. Hetaba, A. Mogilatenko, W. Neumann, P. Schattschneider:
    "An ELNES study of LiAlO2";
    Poster: Microscopy Conference 2009, Graz; 30.08.2009 - 04.09.2009; in: "MC 2009 Graz - Volume 3, Materials Science", W. Grogger, F. Hofer, P. Pölt (Hrg.); Facultas Verlag, Volume 3 / Wien (2009), ISBN: 978-3-85125-062-6; S. 125 - 126.

    Zusätzliche Informationen

  38. W. Hetaba, M. Stöger-Pollach, S. Löffler, P. Schattschneider:
    "Advantages of the modified Becke-Johnson exchange potential for calculating EELS in WIEN2k";
    Poster: 10th Multinational Congress on Microscopy 2011, Urbino University, Italy; 04.09.2011 - 09.09.2011; in: "MCM 2011", (2011), S. 55 - 56.

  39. W. Hetaba, M. Stöger-Pollach, S. Löffler, P. Schattschneider:
    "Advantages of the modified Becke-Johnson Potential in WIEN2k for NiO demonstrated by EELS";
    Poster: MC 2011 Kiel, Kiel, Deutschland; 28.08.2011 - 02.09.2011; in: "Proceedings of the MC 2011 Kiel", Volume 1: Instrumentation and Methods (2011), ISBN: 978-3-00-033910-3; S. IM5.P170.

  40. W. Hetaba, M. Stöger-Pollach, P. Schattschneider, F. Tran, P. Blaha:
    "EELS of NiO: an ELNES study using the modified Becke-Johnson potential";
    Poster: 7. Workshop on EELS & EFTEM, Zürich, Schweiz; 27.10.2010 - 29.10.2010; in: "Electron Microscopy ETH Zürich (EMEZ)", (2010), S. 40.

  41. W. Hetaba, N. Teichert, L. Helmich, A. Hütten, P. Schattschneider:
    "TEM investigation of Multilayer-Heusler Systems for ferroic cooling applications";
    Poster: 18th International Microscopy Congress, Prag; 07.09.2014 - 12.09.2014; in: "18th International Microscopy Congress Proceedings", Czechoslovak Microscopy Society, (2014), ISBN: 978-80-260-6720-7; Paper-Nr. MS-7-P-265, 2 S.

  42. W. Hetaba, M.-G. Willinger, M. E. Schuster, S. Löffler, R. Schlögl, P. Schattschneider:
    "Site-specific ionisation edge fine-structure in the electron microscope";
    Poster: Microscopy Conference 2013, Universität Regensburg, BRD; 25.08.2013 - 30.08.2013; in: "MC2013 Proceedings Part 1", (2013), S. 200 - 201.

  43. W. Hetaba, M.-G. Willinger, M. E. Schuster, S. Löffler, R. Schlögl, P. Schattschneider:
    "Site-specific ionisation fine-structure of Rutile in the electron microscope";
    Poster: European Workshop on Spatially-Resolved Electron Spectroscopy, University of Technology, Graz; 23.04.2014 - 25.04.2014; in: "European Workshop on Spatially-Resolved Electron Spectroscopy&Three Country Workgroup meeting on EELS&EFTEM", (2014).

  44. C. Kramberger, S. Löffler, T. Schachinger, P. Schattschneider:
    "Pure Electron Vortex Beams from a Cylindrical Mode Converter";
    Poster: 19th International Microscopy Congress, Sydney, Australien; 09.09.2018 - 14.09.2018; in: "19th International Microscopy Congress", (2018), 1 S.

  45. S. Löffler, M. Bugnet, N. Gauquelin, R. Hambach, U. Kaiser, G. A. Botton, P. Schattschneider:
    "Spectrum-Imaging of Orbitals: Requirements and Feasibility";
    Poster: European Workshop on Spatially-Resolved Electron Spectroscopy&Three Country Workgroup meeting on EELS&EFTEM, Graz; 23.04.2014 - 25.04.2014; in: "European Workshop on Spatially-Resolved Electron Spectroscopy", (2014).

    Zusätzliche Informationen

  46. S. Löffler, M. Bugnet, N. Gauquelin, R. Hambach, S. Lazar, L. Pardini, C. Draxl, U. Kaiser, G. A. Botton, P. Schattschneider:
    "Can orbitals be mapped in the TEM?";
    Vortrag: 18th International Microscopy Congress, Prag (eingeladen); 07.09.2014 - 12.09.2014; in: "18th International Microscopy Congress Proceedings", Czechoslovak Microscopy Society, (2014), ISBN: 978-80-260-6721-4; Paper-Nr. IT-5-IN-1534, 2 S.

  47. S. Löffler, M. Bugnet, N. Gauquelin, S. Lazar, E. Assmann, K. Held, G. A. Botton, P. Schattschneider:
    "Real-space mapping of electronic orbitals";
    Poster: The 16th European Microscopy Congress, Lyon, France; 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  48. S. Löffler, I. Ennen, C. Kübel, A. Auge, A. Hütten, P. Schattschneider:
    "Site-specific chirality in magnetic transitions";
    Poster: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Volume 1: Physical Sciences: Applications (2012), ISBN: 978-0-9502463-5-2; S. 41.

  49. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider:
    "Non-Lorentzian scattering behavior in core losses";
    Poster: 10th Multinational Congress on Microscopy 2011, Urbino University, Italy; 04.09.2011 - 09.09.2011; in: "MCM 2011", (2011), S. 47 - 48.

  50. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider:
    "Towards orbital mapping in the TEM - Non-Lorentzian angular dependence in core losses";
    Poster: MC 2011 Kiel, Kiel, Deutschland; 28.08.2011 - 02.09.2011; in: "Proceedings of the MC 2011 Kiel", Volume 1: Instrumentation and Methods (2011), ISBN: 978-3-00-033910-3; S. IM5.P168.

  51. S. Löffler, R. Hambach, U. Kaiser, P. Schattschneider:
    "Symmetry Constraints for Mapping Orbitals in Real Space";
    Vortrag: JEELS 2018, Porquerolles, Frankreich; 11.06.2018 - 14.06.2018; in: "JEELS 2018", (2018), S. 67 - 68.

  52. S. Löffler, R. Hambach, U. Kaiser, P. Schattschneider:
    "Symmetry-Constraints for Mapping Electronic States with EELS";
    Vortrag: 19th International Microscopy Congress, Sydney, Australien; 09.09.2018 - 14.09.2018; in: "19th International Microscopy Congress", (2018), 1 S.

  53. S. Löffler, W. Hetaba, P. Schattschneider:
    "Simulating the energy-loss near edge structure for interferometric EELS in reciprocal space";
    Poster: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9; S. 669.

  54. S. Löffler, V. Motsch, W. Hetaba, R. Hambach, G. Biddau, L. Pardini, C. Draxl, U. Kaiser, P. Schattschneider:
    "Towards mapping atomic orbitals in the TEM";
    Poster: Microscopy Conference 2013, Universität Regensburg, BRD; 25.08.2013 - 30.08.2013; in: "MC2013 Proceedings Part 1", (2013), S. 198 - 199.

  55. S. Löffler, V. Motsch, P. Schattschneider:
    "A factorization approach to the density matrix in energy loss spectrometry";
    Poster: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9; S. 671.

  56. S. Löffler, L. Pardini, R. Hambach, U. Kaiser, P. Schattschneider, C. Draxl:
    "Mapping electronic states in Graphene";
    Poster: 18th International Microscopy Congress, Prag; 07.09.2014 - 12.09.2014; in: "18th International Microscopy Congress Proceedings", Czechoslovak Microscopy Society, (2014), ISBN: 978-80-260-6720-7; Paper-Nr. MS-2-P-1536, 2 S.

  57. S. Löffler, T. Schachinger, M. Stöger-Pollach, P. Schattschneider:
    "The Surprising Dynamics of Electron Vortex Beams";
    Vortrag: Microscopy and Microanalysis 2015 Meeting, Portland, Oregon, USA (eingeladen); 02.08.2015 - 06.08.2015; in: "Proceedings of Microscopy & Microanalysis 2015", Microscopy and Microanalysis, 21 (Suppl 3) (2015), ISSN: 1431-9276; S. 19 - 20.

  58. S. Löffler, P. Schattschneider:
    "Elastic propagation of fast electron vortices through crystals";
    Vortrag: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9; S. 571.

  59. S. Löffler, P. Schattschneider:
    "Mode converters realize unitary operators on a two-state quantum system";
    Vortrag: Microscopy Conference 2019, Berlin, Deutschland; 01.09.2019 - 05.09.2019; in: "MC2019 Abstracts", (2019), S. 402 - 403.

  60. S. Löffler, P. Schattschneider:
    "Quantum Experiments in the TEM: Realizing Unitary Operators using Quadrupoles";
    Vortrag: 14th Multinational Congress on Microscopy (MCM 2019), Belgrad, Serbien; 15.09.2019 - 20.09.2019; in: "PROCEEDINGS from the 14th MULTINATIONAL CONGRESS ON MICROSCOPY", (2019), S. 100 - 102.

  61. S. Löffler, P. Schattschneider:
    "Transition probability functions for applications of inelastic core-loss scattering of fast electrons";
    Poster: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9; S. 673.

  62. S. Löffler, P. Schattschneider:
    "Unitary Two-State Quantum Operators Realized by Mode Conversion";
    Poster: 9th ASEM Workshop, Graz; 25.04.2019 - 26.04.2019; in: "9th ASEM Workshop, Workshop Handbook: Program & Abstracts", (2019), S. 49.

  63. S. Löffler, P. Schattschneider, M. Stöger-Pollach, J. Verbeeck:
    "Propagation of electrons carrying topological charge";
    Vortrag: MC 2011 Kiel, Kiel, Deutschland; 28.08.2011 - 02.09.2011; in: "Proceedings of the MC 2011 Kiel", Volume 1: Instrumentation and Methods (2011), ISBN: 978-3-00-033910-3; S. IM2.214.

  64. V. Mauchamp, M. Jaouen, P. Schattschneider:
    "Density Functional Theory study of the core-hole effect in simulations of core-loss spectra.";
    Poster: Microscopy Conference 2009, Graz; 30.08.2009 - 04.09.2009; in: "MC 2009 Graz - Volume 3, Materials Science", W. Grogger, F. Hofer, P. Pölt (Hrg.); Facultas Verlag, Volume 3 / Wien (2009), ISBN: 978-3-85125-062-6; S. 143 - 144.

    Zusätzliche Informationen

  65. V. Motsch, S. Löffler, W. Hetaba, P. Schattschneider:
    "Simulating HR-EFTEM images for orbital mapping";
    Poster: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9; S. 699.

  66. K. Müller, F. Krause, A. Béché, M. Schowalter, V. Galioit, S. Löffler, J. Verbeeck, J. Zweck, P. Schattschneider, A. Rosenauer:
    "Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields";
    Vortrag: Microscopy Conference 2015, Göttingen, Deutschland; 06.09.2015 - 11.09.2015; in: "Microscopy Conference 2015 Proceedings", DGE - German Society for Electron Microscopy, e.V., (2015), S. 580 - 581.

  67. K. Müller-Caspary, M. Duchamp, F. Krause, A. Béché, F. Winkler, S. Löffler, H. Soltau, J. Zweck, P. Schattschneider, J. Verbeeck et al.:
    "Mapping of atomic electric fields and charge densities by momentum-resolved STEM";
    Vortrag: Microscopy Conference 2017, Lausanne, Schweiz (eingeladen); 21.08.2017 - 25.08.2017; in: "MC 2017 Lausanne - Microscopy Conference", (2017), S. 754 - 755.

    Zusätzliche Informationen

  68. K. Müller-Caspary, M. Rösner, M. Duchamp, A. Béché, F. Winkler, F. Krause, I. Lobato, M. Schowalter, V. Migunov, M. Simson, H. Soltau, T. Grieb, S. Löffler, T. Wehling, R. Dunin-Borkowski, S. van Aert, J. Verbeek, P. Schattschneider, J. Zweck, A. Rosenauer:
    "Momentum-resolved STEM measurement of atomic electric fields, charge densities, polarisations and chemical composition";
    Vortrag: 19th International Microscopy Congress, Sydney, Australien (eingeladen); 09.09.2018 - 14.09.2018; in: "19th International Microscopy Congress", (2018), 2 S.

  69. K. Petter, D. Eyidi, M. Stöger-Pollach, I. Sieber, P. Schubert-Bischoff, B. Rau, A. Tham, P. Schattschneider, S. Gall, K. Lips, W. Fuhs:
    "Line defects in epitaxial silicon films grown at 560°C";
    Poster: The 23rd International Conference on Defects in Semiconductors, Awaji Island, Japan; 24.07.2005 - 29.07.2005; in: "Program and Abstracts", (2005).

  70. B. Rau, J. Klein, J. Schneider, E. Conrad, I. Sieber, M. Stöger-Pollach, P. Schattschneider, S. Gall, W. Fuhs:
    "Polycrystalline Si Thin-Film Solar Cells on Glass by Epitaxial Thickening of Seed Layers Using ECRCVD";
    Poster: 20th European Photovoltaic Solar Energy Conference, Barcelona/ Spanien; 06.06.2005 - 10.06.2005; in: "Proceedings of the International Confernece", (2005), S. 1067 - 1070.

  71. B. Rau, K. Petter, S. Brehme, I. Sieber, M. Stöger-Pollach, P. Schattschneider, K. Lips, S. Gall, W. Fuhs:
    "Low-Temperature Epitaxy for Thin-Film Silicon Solar Cells by ECRCVD-Structural and Electronic Properties";
    Poster: 31st IEEE Photovoltaic Specialists Conference, Lake Buena Vista/ Florida; 03.01.2005 - 07.01.2005; in: "Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference-2005", (2005), ISBN: 0-7803-8707-4; S. 1123 - 1126.

  72. B. Rau, K. Petter, S. Brehme, I. Sieber, M. Stöger-Pollach, P. Schattschneider, K. Lips, S. Gall, W. Fuhs:
    "Low-Temperature Epitaxy for Thin-Film Silicon Solar Cells by ECRCVD-Structural and Electronic Properties";
    Vortrag: 31st IEEE Photovoltaic Specialists Conference, Lake Buena Vista/ Florida, Lake Buena Vista/Florida,USA; 03.01.2005 - 07.01.2005; in: "Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference-2005", (2005), S. 1123 - 1126.

  73. B. Rau, K. Petter, I. Sieber, M. Stöger-Pollach, D. Eyidi, P. Schattschneider, S. Gall, K. Lips, W. Fuhs:
    "Extended defects in Si films epitaxially grown by low-temperature ECRCVD";
    Vortrag: The 16th American Conference on Crystal Growth and Epitaxy, Big Sky, MT, USA; 10.07.2005 - 15.07.2005; in: "2005 Abstract Book", Journal of Crystal Growth, (2005).

  74. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. Krause, T. Mehrtens, A. Béché, J. Verbeek, J. Zweck, S. Löffler, P. Schattschneider et al.:
    "Quantitative STEM - From composition to atomic electric fields";
    Vortrag: The 16th European Microscopy Congress, Lyon, France (eingeladen); 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  75. St. Rubino, E. Carlino, P. Schattschneider, G. Rossi, M. Fabrizioli, F. Macherozzi:
    "Circular dichroism in the Tem and in the synchrotron";
    Poster: 7th Multinational Congress on Microscopy, Portoroz/ Slowenien; 26.06.2005 - 30.06.2005; in: "MCM 2005", (2005), ISBN: 961-6303-69-4; S. 281 - 282.

  76. St. Rubino, P. Schattschneider, C. Hébert, C. Hurm, J. Zweck, E. Carlino, M. Fabrizioli, G. Panaccione, G. Rossi, J. Rusz, P. Novák:
    "Detection of Magnetic Circular Dichroism in the TEM";
    Vortrag: IMC'16 The 16th International Microscopy Congress, Sapporo, Japan; 03.09.2006 - 08.09.2006; in: "Microscopy for the 21st Century -- Contribution to Life and Materials Science", (2006), S. 1.

  77. St. Rubino, P. Schattschneider, C. Hébert, C. Hurm, J. Zweck, L. Felisari, E. Carlino, M. Fabrizioli, G. Panaccione, G. Rossi, J. Rusz, P. Novák, P. Formanek, H. Lichte:
    "Magnetic Circular Dichroism in the TEM";
    Vortrag: 5. Workshop on Electron Energy Loss Spectrometry and Energy Filtering, Vienna, Austria; 27.09.2006 - 29.09.2006; in: "AK EELS-EFTEM; 5. Workshop on Electron Loss Spectrometry and Engergy Filtering", J. Luitz et al. (Hrg.); Editio Amici - Physicae et chimicae solidorum amici, (2006), ISBN: 978-3-902548-01-6; S. 1.

  78. T. Schachinger, S. Löffler, A. Steiger-Thirsfeld, M. Stöger-Pollach, S. Schneider, D. Pohl, B. Rellinghaus, P. Schattschneider:
    "Vortex filter-EMCD - challenges and prospects of an alternative EMCD technique";
    Poster: Microscopy Conference 2017, Lausanne, Schweiz; 21.08.2017 - 25.08.2017; in: "MC 2017 Lausanne - Microscopy Conference", (2017), S. 774 - 775.

  79. T. Schachinger, S. Löffler, A. Steiger-Thirsfeld, M. Stöger-Pollach, A. Tavabi, F. Venturi, V. Grillo, M. Horák, C. Eisenmenger-Sittner, R. Dunin-Borkowski, P. Schattschneider:
    "Progress in vortex filter EMCD: Experimental evidence and sub-nanometre resolution";
    Vortrag: Microscopy Conference 2019, Berlin, Deutschland; 01.09.2019 - 05.09.2019; in: "MC2019 Abstracts", (2019), S. 616 - 617.

  80. T. Schachinger, S. Löffler, A. Steiger-Thirsfeld, M. Stöger-Pollach, A. Tavabi, F. Venturi, V. Grillo, M. Horák, C. Eisenmenger-Sittner, R. Dunin-Borkowski, P. Schattschneider:
    "Vortex filter EMCD: Experimental evidence for sub-nanometre resolution";
    Vortrag: Q-SORT International Conference on Quantum Imaging and Electron Beam Shaping, Erlangen, Deutschland (eingeladen); 02.07.2019 - 05.07.2019; in: "Q-SORT", (2019), S. 96 - 98.

  81. T. Schachinger, S. Löffler, M. Stöger-Pollach, A. Steiger-Thirsfeld, P. Schattschneider:
    "Electron vortex propagation in the magnetic lens field";
    Vortrag: Microscopy Conference 2013, Universität Regensburg, BRD; 25.08.2013 - 30.08.2013; in: "MC2013 Proceedings Part 1", (2013), S. 228 - 229.

  82. T. Schachinger, P. Schattschneider, S. Löffler:
    "Resolving Landau State Dynamics with Electron Vortex Beams";
    Vortrag: 18th International Microscopy Congress, Prag; 07.09.2014 - 12.09.2014; in: "18th International Microscopy Congress Proceedings", Czechoslovak Microscopy Society, (2014), ISBN: 978-80-260-6720-7; Paper-Nr. IT-8-O-2020, 2 S.

  83. T. Schachinger, P. Schattschneider, S. Löffler, M. Stöger-Pollach, A. Steiger-Thirsfeld, K. Bliokh, F. Nori:
    "Imaging sub-meV Landau State Dynamics of Electron Vortices";
    Vortrag: 4th ASEM-Workshop, University of Vienna; 08.05.2014 - 09.05.2014; in: "4th ASEM-Workshop on Advanced Electron Microscopy", (2014).

  84. T. Schachinger, A. Steiger-Thirsfeld, S. Löffler, M. Stöger-Pollach, S. Schneider, D. Pohl, B. Rellinghaus, P. Schattschneider:
    "Preparation of high fidelity holographic vortex masks using advanced FIB milling strategies";
    Poster: The 16th European Microscopy Congress, Lyon, France; 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  85. T. Schachinger, A. Steiger-Thirsfeld, S. Löffler, M. Stöger-Pollach, S. Schneider, B. Rellinghaus, P. Schattschneider:
    "Towards EMCD with an electron vortex filter";
    Poster: The 16th European Microscopy Congress, Lyon, France; 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  86. T. Schachinger, A. Steiger-Thirsfeld, M. Stöger-Pollach, P. Schattschneider:
    "Bessel beams with high OAM: prospects for unconventional electrodynamics";
    Vortrag: Microscopy Conference 2015, Göttingen, Deutschland; 06.09.2015 - 11.09.2015; in: "Microscopy Conference 2015 Proceedings", DGE - German Society for Electron Microscopy, e.V., (2015), S. 586 - 587.

  87. T. Schachinger, A. Steiger-Thirsfeld, M. Stöger-Pollach, P. Schattschneider:
    "Electrons with a magnetic moment of 103 bohr magnetons";
    Vortrag: 12th Multinational Congress on Microscopy, Eger, Ungarn; 23.08.2015 - 28.08.2015; in: "12th Multinational Congress on Microscopy", Hungarian Academy of Sciences, Eger, Ungarn (2015), S. 94 - 96.

  88. P. Schattschneider:
    "Circular dichroism in the electron microscope: Progress and applications";
    Vortrag: Joint MMM-Intermag Conference, Washington DC, USA (eingeladen); 18.01.2010 - 22.01.2010; in: "MMM-Intermag Conference", (2010), Paper-Nr. EB-02, 2 S.

  89. P. Schattschneider:
    "Coherence in inelastic electron scattering";
    Vortrag: 5. Workshop on Electron Energy Loss Spectrometry and Energy Filtering, Vienna, Austria; 27.09.2006 - 29.09.2006; in: "AK EELS-EFTEM; 5. Workshop on Electron Loss Spectrometry and Engergy Filtering", J. Luitz et al. (Hrg.); Editio Amici - Physicae et chimicae solidorum amici, (2006), ISBN: 978-3-902548-01-6; S. 1.

  90. P. Schattschneider:
    "EELS";
    Vortrag: CEMES- CNRS, Toulouse, France (eingeladen); 23.10.2006 - 25.10.2006; in: "SCS 2006 - Structural Characterization and Simulation", (2006), S. 1.

  91. P. Schattschneider:
    "Electron Vortex Beams - a Novel Probe for Nanoanalytics";
    Vortrag: 16th Annual Conference YUCOMAT 2014, Herceg Novi, Montenegro (eingeladen); 01.09.2014 - 05.09.2014; in: "Yucomat 2014", (2014), S. 25.

  92. P. Schattschneider:
    "Electron vortex beams - matter waves with angular momentum";
    Vortrag: 15th Joint Vacuum Conference, Vienna (eingeladen); 15.06.2014 - 20.06.2014; in: "15th Joint Vacuum Conference", (2014), S. 192.

  93. P. Schattschneider:
    "Electron vortex beams: Twisted matter waves";
    Vortrag: DPG-Frühjahrstagung 2015 (DPG Spring Meeting) of the Section on Atomic, Molecular, and Plasma Physics and Quantum Optics (SAMOP), Heidelberg (eingeladen); 23.03.2015 - 27.03.2015; in: "Verhandlungen der Deutschen Physicalischen Gesellschaft", 04/2015 (2015), ISSN: 0420-0195.

  94. P. Schattschneider:
    "EMCD - Magnetic Chiral Dichroism in the Electron Microscope";
    Vortrag: Microscopy & Microanalysis 2014, Hartford, CT, USA (eingeladen); 03.08.2014 - 07.08.2014; in: "Microscopy and Microanalysis", Cambridge Journals, 20, Supplement S3 (2014).

  95. P. Schattschneider:
    "From form factors to vortex electrons: Following Ariadne's thread";
    Vortrag: Microscopy Conference 2013, Universität Regensburg, BRD (eingeladen); 25.08.2013 - 30.08.2013; in: "MC2013 Proceedings Part 1", (2013), S. 10.

  96. P. Schattschneider:
    "Fundamentals of EELS";
    Vortrag: European Workshop on Spatially-Resolved Electron Spectroscopy, University of Technology, Graz (eingeladen); 23.04.2014 - 25.04.2014; in: "European Workshop on Spatially-Resolved Electron Spectroscopy&Three Country Workgroup meeting on EELS&EFTEM", (2014).

  97. P. Schattschneider:
    "Inelastic scattering and ultimate resolution limits";
    Vortrag: Summer School of CCEM, Canadian Centre for Electron Microscopy, Canada (eingeladen); 24.06.2013 - 28.06.2013; in: "2013 CCEM Summer School on Electron Microscopy", (2013), S. 1 - 32.

  98. P. Schattschneider:
    "Magnetic chirality in the electron microscope: Progress and Applications";
    Vortrag: DPG Spring Meeting 2010 of the Condensed Matter Section, Regensburg (eingeladen); 21.03.2010 - 26.03.2010; in: "Verhandlungen der Deutschen Physikalischen Gesellschaft", Deutsche Physikalische Gesellschaft, 3 (2010), ISSN: 0420-0195; S. 440.

    Zusätzliche Informationen

  99. P. Schattschneider:
    "Principles of energy loss chiral dichroism in the TEM";
    Vortrag: 10th International Conference on Frontiers of Electron Microscopy in Materials Science, Kasteel Vaalsbroek, Netherlands (eingeladen); 25.09.2005 - 30.09.2005; in: "FEMMS 2005", (2005), S. F5.

  100. P. Schattschneider:
    "Utilizing chirality to explore local magnetic moments";
    Vortrag: 79th Annual Meeting of the DPG and DPG Frühjahrstagung ot the Condensed Matter Section (SKM), Berlin (eingeladen); 15.03.2015 - 20.03.2015; in: "DPG-Frühjahrstagung 2015", 03/2015 (2015), ISSN: 0420-0195.

  101. P. Schattschneider, H. Franco, M. Stöger-Pollach, W. Grogger:
    "Relativistic Effects in Low Energy Loss Spectra";
    Poster: ACMM (19) - Australian Conference on Microscopy and Microanalysis, Sydney, Australien; 05.02.2006 - 09.02.2006; in: "ACMM (19) - Program & Abstracts", Abstract 131 (2006), ISBN: 0-9580408-4-2; S. 1.

  102. P. Schattschneider, H. Franco, M. Stöger-Pollach, W. Grogger:
    "Relativistic Effects in Low Energy Loss Spectra";
    Poster: Australian Conference on Microscopy and Microanalysis, Sydney Australien; 05.02.2006 - 09.02.2006; in: "ACMM (19), Sydney 2006", (2006), S. 131.

  103. P. Schattschneider, V. Grillo, T. Schachinger, S. Löffler:
    "Spin polarisation with electron Bessel beams?";
    Poster: The 16th European Microscopy Congress, Lyon, France; 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  104. P. Schattschneider, C. Hébert, St. Rubino:
    "Principles of Magnetic Dichroic Experiments in the Electron Microscope";
    Poster: Satellite workshop to SOLEIL Users Meeting, Paris, France; 16.01.2006 - 19.01.2006; in: "Colloque Magnétisme de soleil synchotron, Workshop Magnétism", (2006), S. 1.

  105. P. Schattschneider, C. Hébert, St. Rubino:
    "XMCD IN THE ELECTRON MICROSCOPE: USING ELECTRONS INSTEAD OF PHOTONS AS A PROBE";
    Vortrag: 4th International Workshop on Nanoscale Spectroscopy and Nanotechnology, Rathen, Germany (eingeladen); 17.09.2006 - 21.09.2006; in: "Nanoscale Spectroscopy and Nanotechnology", (2006), S. 1.

  106. P. Schattschneider, S. Löffler:
    "Magnetic Circular Dichroism in Energy Loss Spectrometry";
    Vortrag: Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2017 (SIMDALEE2017), Pula, Sardinien (eingeladen); 18.09.2017 - 22.09.2017; in: "Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2017 (SIMDALEE2017)", (2017), S. 67.

  107. P. Schattschneider, S. Löffler, R. Feder:
    "Entropy and Entanglement in Electron Scattering";
    Vortrag: JEELS 2018, Porquerolles, Frankreich; 11.06.2018 - 14.06.2018; in: "JEELS 2018", (2018), S. 21.

  108. P. Schattschneider, St. Rubino, C. Hébert, E. Carlino, P. Novák, J. Rusz:
    "CHIRALTEM: Circular Dichroism in the Electron Microscope";
    Vortrag: ACMM (19) - Australian Conference on Microscopy and Microanalysis, Sydney, Australien; 05.02.2006 - 09.02.2006; in: "ACMM (19) - Program & Abstracts", P. Munroe et al. (Hrg.); Abstract 22 (2006), ISBN: 0-9580408-4-2; S. 1.

  109. P. Schattschneider, St. Rubino, C. Hébert, E. Carlino, P. Novák, J. Rusz:
    "Observation of Circular Dichroism in EELS";
    Vortrag: JEELS 06, Château Royal de Blois, France; 15.05.2006 - 17.05.2006; in: "JEELS 06 - Cinquième "journées de spectroscopie de pertes d'énergie des élecrons"", (2006), S. 1.

  110. P. Schattschneider, T. Schachinger, S. Löffler:
    "Ten years of EMCD: what has been achieved";
    Vortrag: The 16th European Microscopy Congress, Lyon, France; 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  111. P. Schattschneider, T. Schachinger, M. Stöger-Pollach, S. Löffler, A. Steiger-Thirsfeld, K. Bliokh:
    "Mode conversion, peculiar rotations, and the Landau-Zeeman-Berry phase in electron vortex beams";
    Vortrag: Microscopy Conference 2013, Universität Regensburg, BRD (eingeladen); 25.08.2013 - 30.08.2013; in: "MC2013 Proceedings Part 2", (2013), S. 548 - 549.

  112. P. Schattschneider, M. Stöger-Pollach, S. Löffler, T. Schachinger, K. Bliokh:
    "Peculiar rotation of electron vortices in magnetic fields";
    Vortrag: ICOAM 2013, The Burrell Collection, Glasgow, UK (eingeladen); 03.06.2013 - 05.06.2013; in: "2th International Conference on Optical Angular Momentum", (2013), S. 11 - 12.

  113. P. Schattschneider, M. Stöger-Pollach, S. Löffler, T. Schachinger, K. Bliokh:
    "Vortices and EELS: EMCD and other tricky issues";
    Vortrag: EDGE 2013, Sainte Maxime, France; 26.05.2013 - 31.05.2013; in: "Enhanced Data Generated by Electrons 2013", (2013), S. T-4.

  114. P. Schattschneider, M. Stöger-Pollach, F. Tian, J. Verbeeck:
    "EMCD with nm Resolution and Below: Experiments, Proposals and a Paradox";
    Vortrag: 14th European Microscopy Congress EMC 2008, Achen, Germany; 01.09.2008 - 05.09.2008; in: "EMC 2008, Vol.1 Instrumentation and Methods", Springer-Verlag, 1 / Berlin Heidelberg (2008), ISBN: 978-3-540-85154-7; S. 349 - 350.

  115. P. Schattschneider, J. Verbeeck, S. Löffler, M. Stöger-Pollach:
    "Electrons with a twist: Chiral electronic transitions and vortex beams";
    Vortrag: 10th Multinational Congress on Microscopy 2011, Urbino University, Italy; 04.09.2011 - 09.09.2011; in: "MCM 2011", (2011), S. 7 - 8.

  116. P. Schattschneider, J. Verbeeck, M. Stöger-Pollach:
    "Mode conversion of vortex electrons";
    Vortrag: 15th European Microscopy Congress, Manchester, UK; 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9; S. 431.

  117. S. Schneider, D. Pohl, S. Löffler, D. Kasinathan, J. Rusz, P. Schattschneider, L. Schultz, B. Rellinghaus:
    "Quantifying magnetism on the nanometer scale: EMCD on individual FePt nanoparticles";
    Poster: The 16th European Microscopy Congress, Lyon, France; 28.08.2016 - 02.09.2016; in: "The 16th European Microscopy Congress", (2016).

  118. S. Schneider, D. Pohl, S. Löffler, T. Schachinger, P. Schattschneider, L. Schultz, B. Rellinghaus:
    "Probing magnetic properties on the nm scale: EMCD on individual FePt nanocubes";
    Poster: Microscopy Conference 2015, Göttingen, Deutschland; 06.09.2015 - 11.09.2015; in: "Microscopy Conference 2015 Proceedings", DGE - German Society for Electron Microscopy, e.V., (2015), S. 603 - 604.

  119. M. Stöger-Pollach, C. Hébert, P. Schattschneider, A. Laister:
    "Retardation Effects in Valence - EELS Spectra";
    Vortrag: Microscopy and Microanalysis, Chicago, Illinois, USA; 30.07.2006 - 03.08.2006; in: "Microscopy and Microanalysis", 12 (2006), ISSN: 1431-9276; S. 1136 CD - 1137 CD.

  120. M. Stöger-Pollach, A. Laister, T. Galek, P. Schattschneider:
    "Relativistic effects in valence EELS";
    Poster: JEELS 06, Château Royal de Blois, France; 15.05.2006 - 17.05.2006; in: "JEELS 06 - Cinquième "journées de spectroscopie de pertes d'énergie des élecrons"", (2006), S. 1.

  121. M. Stöger-Pollach, A. Laister, P. Schattschneider, J. Bernardi:
    "Optical properties obtained by electron energy loss spectrometry";
    Poster: 14. Tagung Festkörperanalytik, Technische Universität Wien; 16.07.2007 - 18.07.2007; in: "14. Tagung Festkörperanalytik", (2007), S. P 5.

  122. M. Stöger-Pollach, S. Lazar, B. Schaffer, P. Schattschneider, H. Zandbergen:
    "Cerenkov losses in valence EELS";
    Poster: International EELS Workshop, Grundlsee, Grundlsee; 01.05.2005 - 05.05.2005; in: "Enhanced Data Generated with Electrons", (2005), S. 74.

  123. M. Stöger-Pollach, S. Löffler, W. Hetaba, P. Schattschneider:
    "Investigating the optical properties of AlxGa1-xAs by low voltage VEELS";
    Poster: 10th Multinational Congress on Microscopy 2011, Urbino University, Italy; 04.09.2011 - 09.09.2011; in: "MCM 2011", 1 (2011), 2 S.

  124. M. Stöger-Pollach, St. Rubino, C. Hébert, P. Schattschneider:
    "Improving the intensity in CHIRALTEM experiments";
    Poster: 5. Workshop on Electron Energy Loss Spectrometry and Energy Filtering, Vienna, Austria; 27.09.2006 - 29.09.2006; in: "AK EELS-EFTEM; 5. Workshop on Electron Loss Spectrometry and Engergy Filtering", J. Luitz et al. (Hrg.); Editio Amici - Physicae et chimicae solidorum amici, (2006), ISBN: 978-3-902548-01-6; S. 1.

  125. M. Stöger-Pollach, St. Rubino, C. Hébert, P. Schattschneider:
    "Improving the intensity in CHIRALTEM experiments";
    Poster: AK EELS-EFTEM, Vienna University of Technology, Austria; 27.09.2006 - 29.09.2006; in: "5th Workshop on Electron Energy Loss Spectrometry and Energy Filtering", (2006).

  126. M. Stöger-Pollach, P. Schattschneider, U. Kaiser, J. Biskupek, G. Benner:
    "Low voltage beams in EELS and EFTEM";
    Vortrag: 7. Workshop on EELS & EFTEM, Zürich, Schweiz; 27.10.2010 - 29.10.2010; in: "Electron Microscopy ETH Zürich (EMEZ)", (2010), S. 36.

  127. M. Stöger-Pollach, P. Schattschneider, A. Laister:
    "Retardation effects in valence - EELS spectra";
    Vortrag: 5. Workshop on electron energy loss spectrometry and energy filtering, Vienna University of Technology, Austria; 27.09.2006 - 29.09.2006; in: "AK EELS - EFTEM 2006", J. Luitz, C. Hébert, P. Schattschneider (Hrg.); Editio Amici - Physicae et chimicae solidorum amici, Beatrixgasse 26/86, 1030 Wien, Austria (2006), 3-902548-01-6; S. 1 - 46.

  128. M. Stöger-Pollach, P. Schattschneider, A. Laister:
    "Retardation effects in valence EELS spectra";
    Vortrag: 5. Workshop on Electron Energy Loss Spectrometry and Energy Filtering, Vienna, Austria; 27.09.2006 - 29.09.2006; in: "AK EELS-EFTEM; 5. Workshop on Electron Loss Spectrometry and Engergy Filtering", J. Luitz et al. (Hrg.); Editio Amici - Physicae et chimicae solidorum amici, (2006), ISBN: 978-3-902548-01-6; S. 1.

  129. M. Stöger-Pollach, P. Schattschneider, J. Perkins, D. McComb:
    "EMCD at high spatial resolution: comparison of STEM with EELS profiling";
    Vortrag: 14th European Microscopy Congress., Aachen, Germany; 01.09.2008 - 05.09.2008; in: "EMC 2008; Preface Volume 1: Instrumentation and Methods", 2008 Springer-Verlag, (2008), ISBN: 978-3-540-85154-7; S. 443 - 444.

  130. M. Stöger-Pollach, P. Schattschneider, P. Pongratz:
    "Investigation of Al-Si Schottky barriers by means of EELS";
    Poster: Microscopy of Semiconducting Materials XIV, University of Oxford,UK; 11.04.2005 - 14.04.2005; in: "Microscopy of Semiconducting Materials XIV", (2005).

  131. J. Verbeeck, G. Bertoni, H. Lichte, D. Van Dyck, P. Schattschneider:
    "Interpreting Plasmon Holography Experiments";
    Vortrag: IMC'16 The 16th International Microscopy Congress, Sapporo, Japan; 03.09.2006 - 08.09.2006; in: "Microscopy for the 21st Century -- Contribution to Life and Materials Science", (2006), S. 1517.

  132. J. Verbeeck, G. Bertoni, D. Van Dyck, H. Lichte, P. Schattschneider:
    "Partial coherence in inelastic holography";
    Vortrag: 14th European Microscopy Congress EMC 2008, Aachen; 01.09.2008 - 05.09.2008; in: "EMC 2008, Vol.1 Instrumentation and Methods", Springer-Verlag, 1 / Berlin Heidelberg (2008), ISBN: 978-3-540-85154-7; S. 243 - 244.

  133. J. Verbeeck, C. Hébert, St. Rubino, P. Novák, J. Rusz, F. Houdellier, C. Gatel, P. Schattschneider:
    "Optimal aperture sizes and positions for EMCD experiments";
    Vortrag: 14th European Microscopy Congress EMC 2008, Aachen, Germany; 01.09.2008 - 05.09.2008; in: "EMC 2008, Vol.1 Instrumentation and Methods", Springer-Verlag, 1 / Berlin Heidelberg (2008), ISBN: 978-3-540-85154-7; S. 453 - 454.

  134. J. Verbeeck, H. Tian, A. Beche, S. Lazar, S. Löffler, M. Stöger-Pollach, P. Schattschneider, G. Van Tendeloo:
    "Vortex electrons as a probe for novel spectroscopic information at the atomic scale";
    Vortrag: 15th European Microscopy Congress, Manchester, UK (eingeladen); 16.09.2012 - 21.09.2012; in: "Proceedings of the 15th European Microscopy Congress", D.J. Stokes, W.M. Rainforth (Hrg.); The Royal Microscopical Society, Vol. 2: Physical Sciences: Tools and Techniques (2012), ISBN: 978-0-9502463-6-9; S. 657.

  135. Y. Wang, O. Van Der Biest, I. Gordon, D. Van Gestel, G. Beaucarne, J. Poortmans, M. Stöger-Pollach, P. Schattschneider, S. Gall:
    "Antimony induced crystallisation of amorphous silicon";
    Poster: 20th European Photovoltaic Solar Energy Conference, Barcelona/ Spanien; 06.06.2005 - 10.06.2005; in: "Proceedings of the International Conference", (2005), S. 1179 - 1181.

  136. J. Zweck, K. Müller, F. Krause, A. Béché, M. Schowalter, V. Galioit, S. Löffler, J. Verbeeck, P. Schattschneider, A. Rosenauer:
    "Exploring the space between atoms: interatomic Electric fields imaged by STEM-DPC";
    Vortrag: 12th Multinational Congress on Microscopy, Eger, Ungarn (eingeladen); 23.08.2015 - 28.08.2015; in: "12th Multinational Congress on Microscopy", Hungarian Academy of Sciences, Eger, Ungarn (2015), S. 84 - 85.


Vorträge und Posterpräsentationen (ohne Tagungsband-Eintrag)


  1. G. Beaucarne, D. Van Gestel, I. Gordon, L. Carnel, K. Van Nieuwenhuysen, C. Ornaghi, J. Poortmans, M. Stöger-Pollach, P. Schattschneider:
    "Aluminium-Induced Crystallization of silicon on High Temperature Substrates for Thin-Film Crystalline Silicon Solar Cells";
    Vortrag: 19th European Photovoltaic Solar Energy Conference, Paris, Frankreich; 07.06.2004 - 11.06.2004.

  2. J. Bernardi, M. Stöger-Pollach, S. Löffler, P. Schattschneider, T. Schachinger:
    "Advanced characterisation of nanostructures and interfaces";
    Vortrag: 1st International Conference on coatings, Thin Films, Multi Layer Devices & Systems - NFTDC, Hyderabad, Indien (eingeladen); 14.12.2016 - 16.12.2016.

  3. J. Bernardi, M. Stöger-Pollach, S. Löffler, P. Schattschneider, T. Schachinger:
    "Advanced characterization of nanostructures and interfaces";
    Vortrag: Erich Schmid Colloquium, Leoben (eingeladen); 28.06.2017.

  4. J. Bernardi, M. Stöger-Pollach, S. Löffler, P. Schattschneider, T. Schachinger:
    "Transmission electron microscopy, imaging and beyond";
    Vortrag: 3rd Indo-Austrian-Symposium on Advances in Materials Engineering (AME 2016), Mumbai, Indien (eingeladen); 19.12.2016 - 20.12.2016.

  5. J. Bernardi, M. Stöger-Pollach, P. Schattschneider:
    "Electron Microscopy for Materials Characterization with High Spatial Resolution";
    Vortrag: Indo-Austrian Symposium 2010: Advanced Materials Engineering, Nonferrous Materials Technology Development Centre Hyderabad - 500058, India (eingeladen); 08.12.2010 - 09.12.2010.

  6. J. Bernardi, M. Stöger-Pollach, P. Schattschneider:
    "Electron microscopy of nanostructures";
    Vortrag: International Symposium on Advances in Nanomaterials (ANM2010), Central Glass and Ceramic Research Institute Kolkata 700032, India (eingeladen); 06.12.2010 - 07.12.2010.

  7. M. Bugnet, S. Löffler, D. Hawthorn, G. Sawatzky, P. Schattschneider, G. Radtke, G. A. Botton:
    "Quantifying the carrier distribution in hole-doped cuprates using atomic resolution near-edge structures: the case of Sr3Ca11Cu24O41";
    Poster: EDGE 2017, Okinawa, Japan; 14.05.2017 - 19.05.2017.

  8. M. Bugnet, S. Löffler, D. Hawthorn, G. Sawatzky, P. Schattschneider, G. Radtke, G. A. Botton:
    "Quantifying the carrier distribution in hole-doped cuprates using atomic resolution near-edge structures: the case of Sr3Ca11Cu24O41";
    Vortrag: EDGE 2017, Okinawa, Japan; 14.05.2017 - 19.05.2017.

  9. M. Bugnet, G. Radtke, S. Löffler, H. Dabkowska, G. Luke, P. Schattschneider, D. Hawthorn, G. Sawatzky, G. A. Botton:
    "Hole Distribution in Cuprate Superconductors by Atomic-Scale STEM-EELS";
    Vortrag: 2015 MRS Spring Meeting & Exhibit, San Francisco (eingeladen); 06.04.2015 - 10.04.2015.

  10. M. Bugnet, G. Radtke, S. Löffler, D. Hawthorn, G. Sawatzky, P. Schattschneider, G. A. Botton:
    "Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors";
    Vortrag: 42nd MSC-SMC Annual Meeting 2015, Hamilton, Ontario, Canada; 26.05.2015 - 29.05.2015.

  11. L. Calmels, P. Schattschneider, F. Houdellier, B. Warot-Fonrose:
    "Analytical orbital and spin sum rules for magnetic circular dichroism spectra in a transmission electron microscope";
    Poster: 3rd Chiraltem Workshop, Trieste, Italien; 31.05.2007 - 01.06.2007.

  12. I. Ennen, S. Löffler, M. Stöger-Pollach, P. Schattschneider:
    "Energy Loss Magnetic Chiral Dichroism: A Tool for the Investigation of Magnetism on the Nanoscale";
    Poster: Materials Science and Engineering MSE 2010, Frankfurt; 24.08.2010 - 26.08.2010.

  13. I. Ennen, S. Löffler, M. Stöger-Pollach, P. Schattschneider, A. Hütten:
    "Highlights and applications of energy loss magnetic chiral dichroism";
    Vortrag: 7. Workshop on EELS & EFTEM, Zürich, Schweiz; 27.10.2010 - 29.10.2010.

  14. D. Eyidi, C. Hébert, P. Schattschneider:
    "Is Parallel illumination Possible in the TEM ?";
    Vortrag: 6. Dreiländertagung 2005, Davos/ Schweiz; 28.08.2005 - 02.09.2005.

  15. D. Eyidi, C. Hébert, P. Schattschneider:
    "P-FKP40: Is Parallel Illumination Possible in the TEM ?";
    Poster: 55. Jahrestagung der Österreichischen Physikalischen Gesellschaft, Wien; 27.09.2005 - 29.09.2005.

  16. D. Eyidi, M. Stöger-Pollach, P. Schattschneider:
    "Influence of hydrogen atmosphere on epitaxy";
    Vortrag: METEOR Meeting, Leuven/ Belgien; 20.01.2005 - 21.01.2005.

  17. L. Felisari, F. Maccherozzi, St. Rubino, P. Schattschneider, G. Panaccione, G. Rossi, E. Carlino:
    "XMCD and EMCD: two complementary techniques?";
    Poster: 3rd Chiraltem Workshop, Trieste, Italien; 31.05.2007 - 01.06.2007.

  18. T. Galek, C. Hébert, D. Eyidi, P. Schattschneider, H. Figiel:
    "Electron Energy Loss Spectroscopy of Rare Earth-Transition Metal Compounds and Their Hydrides ReMn2(H2) (Re=Gd,Er) Aided With Ab Initio Calculations Using WIEN2k";
    Poster: 6. Dreiländertagung 2005, Davos/ Schweiz; 28.08.2005 - 02.09.2005.

  19. T. Galek, C. Hébert, D. Eyidi, P. Schattschneider, H. Figiel:
    "P-FKP26: Electron Energy Loss Spectroscopy of Rare Earth-Transition Metal Compounds and Their Hydrides ReMn2(H2) (Re=Gd,Er) Aided With Ab Initio Calculations Using WIEN2k";
    Poster: 55. Jahrestagung der Österreichischen Physikalischen Gesellschaft, Wien; 27.09.2005 - 29.09.2005.

  20. T. Galek, C. Hébert, T. Moskalewicz, H. Figiel, P. Schattschneider:
    "Plasmon spectroscopy of pure and hydrogenated GdMn2, ErMn2 and TbMn2";
    Poster: International Symposium on Metal-hydrogen systems fundamentals and applications, Cracow, Poland; 05.09.2004 - 10.09.2004.

  21. S. Gall, J. Schneider, J. Klein, K. Hübener, M. Muske, B. Rau, E. Conrad, I. Sieber, K. Petter, K. Lips, M. Stöger-Pollach, P. Schattschneider, W. Fuhs:
    "Large-Grained Polycrystalline Silicon On Glass For Thin-Film Solar Cells";
    Vortrag: European Materials Research Society Spring Meeting 2005, E-MRS 2005 Spring Meeting, Strasbourg (France) (eingeladen); 31.05.2005 - 03.06.2005.

  22. S. Gall, J. Schneider, J. Klein, M. Muske, B. Rau, E. Conrad, I. Sieber, W. Fuhs, C. Ornaghi, D. Van Gestel, I. Gordon, K. Van Nieuwenhuysen, G. Beaucarne, J. Poortmans, M. Stöger-Pollach, J. Bernardi, P. Schattschneider, Y. Wang, O. Van Der Biest:
    "Crystalline Silicon Thin-Film solar cells on foreign substrates: The European Project Meteor";
    Vortrag: 19th European Photovoltaic Solar Energy Conference, Paris, Frankreich; 07.06.2004 - 11.06.2004.

  23. I. Gebeshuber, J. Bernardi, P. Schattschneider:
    "The University Centre for Transmission Electron Microscopy (USTEM)";
    Poster: Euro-Summer School on Electron Crystallography 2001, Barcelona, Barcelona, Spain; 2001.

  24. C. Hébert, C. Eisenmenger-Sittner, P. Schattschneider:
    "Application of the Virtual Crystal Approximation to Elnes Calculations: The Cu L3 Edge in Cuni Alloys";
    Poster: 6th Multinational Congress on Microscopy - European Extension, Pula, Croatia; 01.06.2003 - 05.06.2003.

  25. C. Hébert, H. Franco, P. Schattschneider:
    "Magic Angle in EELS - the Sequel";
    Vortrag: 6. Dreiländertagung 2005, Davos/ Schweiz; 28.08.2005 - 02.09.2005.

  26. C. Hébert, J. Luitz, C. Ambrosch-Draxl, P. Schattschneider:
    "Core loss spectroscopies- a comparison between ELNES and XANES";
    Vortrag: International Seminar on photoionization in Atom, Kyoto, Japan (eingeladen); 19.08.2002 - 20.08.2002.

  27. C. Hébert, J. Luitz, P. Schattschneider:
    "The Cu L3 Edge in Cu-Ni Alloys: Comparison between the VCA and Supercell Calculations";
    Poster: 15th International Congress on Electron Microscopy, Durban, South Africa; 01.09.2002 - 06.09.2002.

  28. C. Hébert, J. Luitz, P. Schattschneider, B. Jouffrey, E.K. Hlil:
    "Circular dichroism in the Electron Microscope";
    Vortrag: Strategies and advances in Atomic Level Spectroscopy and Analysis, Guadeloupe, French West Indies; 05.05.2002 - 09.05.2002.

  29. C. Hébert, A. Satz, P. Schattschneider:
    "Experimental determination of inelastic lifetimes of hot electrons using low- loss EELS";
    Poster: International EELS Workshop, Grundlsee; 01.05.2005 - 05.05.2005.

  30. C. Hébert, A. Satz, P. Schattschneider:
    "Lifetime of Hot Electrons in Copper Obtained from Low- Loss EELS";
    Poster: 6. Dreiländertagung 2005, Davos/ Schweiz; 29.08.2005 - 02.09.2005.

  31. C. Hébert, P. Schattschneider:
    "Density Functional Theory as a Tool for the Electron Microscopist";
    Vortrag: Int. Konferenz Microscopy & Microanalysis 2002, Quebec, Canada; 05.08.2002 - 08.08.2002.

  32. C. Hébert, P. Schattschneider:
    "Interpretation of Electron Energy loss Spectra via Band Structure Calculations";
    Poster: EUROMAT 2003, Lausanne, Schweiz (eingeladen); 01.09.2003 - 05.09.2003.

  33. C. Hébert, P. Schattschneider, B. Jouffrey:
    "ELNES at Magic Angle Conditions";
    Poster: International EELS Workshop, Grundlsee; 01.05.2005 - 05.05.2005.

  34. C. Hébert, P. Schattschneider, B. Jouffrey:
    "Magic Angle: an unsolved mystery";
    Poster: 13th European Microscopy Congress EMC 2004, Antwerpen, Belgien; 22.08.2004 - 27.08.2004.

  35. C. Hébert, P. Schattschneider, J. Kusinski, C. Petot, G. Petot-Ervas:
    "Oxygen K ELNES in cobalt monoxide";
    Poster: Strategies and advances in Atomic Level Spectroscopy and Analysis, Guadeloupe, French West Indies; 05.05.2002 - 09.05.2002.

  36. C. Hébert, P. Schattschneider, M. Stöger-Pollach, D.S. Su:
    "Core Holes, Low-Lying Edges and Elnes: Subtle Details of Wien97";
    Poster: 15th International Congress on Electron Microscopy, Durban, South Africa; 01.09.2002 - 06.09.2002.

  37. C. Hébert, J. Verbeeck, J. Rusz, F. Houdellier, St. Rubino, B. Warot-Fonrose, P. Schattschneider:
    "Optimizing S/N ratio in CHIRALTEM experiments";
    Vortrag: 3rd Chiraltem Workshop, Trieste, Italien; 31.05.2007 - 01.06.2007.

  38. W. Hetaba, S. Löffler, P. Schattschneider:
    "Simulations of energy loss spectra: Advances and future prospects";
    Vortrag: 2nd ASEM - Workshop, Salzburg, Österreich; 26.04.2012 - 27.04.2012.

  39. W. Hetaba, S. Löffler, P. Schattschneider:
    "Site selective analysis under electron channeling conditions";
    Vortrag: 1st ASEM-Workshop, Graz; 07.04.2011 - 08.04.2011.

  40. W. Hetaba, S. Löffler, P. Schattschneider:
    "Site selective analysis using electron channelling";
    Vortrag: 7. Workshop on EELS & EFTEM, Zürich, Schweiz; 27.10.2010 - 29.10.2010.

  41. W. Hetaba, P. Schattschneider, M. Stöger-Pollach:
    "Advantages of the modified Becke-Johnson exchange potential for calculating EELS in WIEN2k";
    Poster: 16. Tagung Festkörperanalytik, TU Wien; 04.07.2011 - 06.07.2011.

  42. W. Hetaba, M.-G. Willinger, M. E. Schuster, S. Löffler, R. Schlögl, P. Schattschneider:
    "Site-specific ionisation edge fine-structure in the electron microscope";
    Vortrag: 3rd ASEM-Workshop on Advanced Electron Microscopy, Medical University of Vienna; 25.04.2013 - 26.04.2013.

  43. F. Houdellier, B. Warot-Fonrose, M.J. Hytch, E. Snoeck, L. Calmels, V. Serin, P. Schattschneider:
    "Dichroisme circulaire magnétique EMCD (Electron Energy Loss Magnetic Chiral Dichroism) dans un micorscope électronique en transmission équipé d´un correcteur d´aberration sphérique";
    Poster: Société Fancaise des Microscopies Xéme Colloque, Grenoble, Frankreich; 05.06.2007 - 08.06.2007.

  44. F. Houdellier, B. Warot-Fonrose, M.J. Hytch, E. Snoeck, L. Calmels, V. Serin, P. Schattschneider:
    "New Electron Energy Loss Magnetic Chiral Dichroism (EMCD)";
    Vortrag: Microscopy Conference MC 2007, Saarland University, Saarbrücken, Germany; 02.09.2007 - 07.09.2007.

  45. C. Hurm, M. Stöger-Pollach, St. Rubino, C. Hébert, P. Schattschneider, J. Zweck:
    "Verification of Electron Magnetic Chiral Dichroism in a TEM by Reversing";
    Vortrag: Microscopy Conference MC 2007, Saarland Universtity, Saarbrücken, Germany; 02.09.2007 - 07.09.2007.

  46. C. Hurm, M. Stöger-Pollach, St. Rubino, C. Hébert, P. Schattschneider, J. Zweck:
    "Verification of electron magnetic chiral dichroism in a TEM by reversing the specimen's magnetisation";
    Vortrag: MC 2007 of the DGE, Saarland University, Saarbrücken, Germany; 02.09.2007 - 07.09.2007.

  47. B. Jouffrey, C. Hébert, P. Schattschneider:
    "Orientation effects in Electron Electron Energy Loss Spectrometry : on the physics of the magic angle observed with anisotropic materials";
    Vortrag: Symposium on Techniques and Methods of Microstructure Characterization in Nanoscale, Krakow, Polen (eingeladen); 18.06.2004.

  48. B. Jouffrey, P. Schattschneider, C. Hébert:
    "Inelastic Events: Some Physics behind and their use in Electron Microscopy";
    Vortrag: 5th Multinational Congress on Electron Microscopy, Lecce, Italien; 20.09.2002 - 25.09.2002.

  49. J. Kusinski, G. Petot-Ervas, C. Petot, B. Jouffrey, P. Schattschneider:
    "Microstructure and nanochemistry of Ca doped Co oxide single crystals";
    Vortrag: XI International Conference on Electron Microscopy of Solids, Krynica, Polen; 19.05.2002 - 23.05.2002.

  50. H. Lichte, P. Potapov, D. Van Dyck, P. Schattschneider:
    "Coherence in a Plasmon-Scattered Wavefield";
    Poster: Microscopy Conference MC 2003, Dresden, Deutschland; 07.09.2003 - 12.09.2003.

  51. S. Löffler, M. Bugnet, N. Gauquelin, S. Lazar, R. Hambach, E. Assmann, K. Held, U. Kaiser, G. A. Botton, P. Schattschneider:
    "Mapping Orbital Information";
    Vortrag: 2015 MRS Spring Meeting & Exhibit, San Francisco (eingeladen); 06.04.2015 - 10.04.2015.

  52. S. Löffler, M. Bugnet, L. Pardini, G. Biddau, N. Gauquelin, S. Lazar, E. Assmann, K. Held, C. Draxl, U. Kaiser, G. A. Botton, P. Schattschneider:
    "Real-Space Mapping of Electronic Orbitals";
    Vortrag: 20th conference on Solid State Analysis / 20. Tagung Festkörperanalytik, Wien; 01.07.2019 - 03.07.2019.

  53. S. Löffler, I. Ennen, C. Kübel, D. Wang, A. Auge, A. Hütten, P. Schattschneider:
    "Site-specific measurements of magnetic transitions using energy-loss magnetic chiral dichroism";
    Vortrag: 3rd ASEM-Workshop on Advanced Electron Microscopy, Medical University of Vienna; 25.04.2013 - 26.04.2013.

  54. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider:
    "Energy-loss magnetic chiral dichroism - Investigating magnetism on the nanometer scale";
    Vortrag: Junior Scientist Conference 2010, Vienna University of Technology; 07.04.2010 - 09.04.2010.

  55. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider:
    "Energy-loss magnetic chiral dichroism - Investigating magnetism on the nanometer scale";
    Poster: Junior Scientist Conference 2010, Vienna University of Technology; 07.04.2010 - 09.04.2010.

  56. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider:
    "Energy-Loss Magnetic Chiral Dichroism - Investigating Magnetism on the Nanometer Scale";
    Poster: 16. Tagung Festkörperanalytik, TU Wien, Österreich; 04.07.2011 - 06.07.2011.

  57. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider:
    "Non-Lorentzian scattering behavior in core-losses - a glimpse of wave functions";
    Vortrag: 7. Workshop on EELS & EFTEM, Zürich, Schweiz; 27.10.2010 - 29.10.2010.

  58. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider:
    "Non-Lorentzian Scattering Behavior in Core-Losses - A Glimpse of Wave Functions";
    Vortrag: 1st ASEM-Workshop , Advanced Electron Microscopy, TU Graz; 07.04.2011 - 08.04.2011.

  59. S. Löffler, I. Ennen, M. Stöger-Pollach, P. Schattschneider, J. Verbeeck:
    "Magnetic dichroism on the nanoscale";
    Vortrag: 3rd ANKA/KNMF Users' Meeting 2011, Karlsruhe, BRD (eingeladen); 13.10.2011 - 14.10.2011.

  60. S. Löffler, W. Hetaba, M. Bugnet, M.-G. Willinger, M. E. Schuster, N. Gauquelin, S. Lazar, E. Assmann, K. Held, G. A. Botton, R. Schlögl, P. Schattschneider:
    "Mapping electronic orbitals in the TEM";
    Poster: 4th Annual SFB FOXSI PhD Workshop, Göstling/Ybbs; 07.04.2014 - 10.04.2014.

  61. S. Löffler, W. Hetaba, M. Bugnet, M.-G. Willinger, M. E. Schuster, N. Gauquelin, S. Lazar, E. Assmann, K. Held, G. A. Botton, R. Schlögl, P. Schattschneider:
    "Mapping electronic orbitals in the TEM";
    Vortrag: 42nd MSC-SMC Annual Meeting 2015, Hamilton, Ontario, Canada; 26.05.2015 - 29.05.2015.

  62. S. Löffler, W. Hetaba, M.-G. Willinger, M. E. Schuster, N. Gauquelin, S. Lazar, E. Assmann, K. Held, G. A. Botton, R. Schlögl, P. Schattschneider:
    "Mapping electronic orbitals in the TEM";
    Poster: Annual SFB FOXSI Symposium 2015, PhD WS "FOXSKI", Haus im Ennstal, NÖ; 29.03.2015 - 01.04.2015.

  63. S. Löffler, V. Motsch, W. Hetaba, R. Hambach, G. Biddau, L. Pardini, C. Draxl, U. Kaiser, P. Schattschneider:
    "Towards mapping atomic orbitals in the TEM";
    Poster: Inauguration of the Vienna UltraSTEM lab workshop: New avenues for materials research by high-resolution microscopy, Wien, Österreich; 28.11.2013.

  64. S. Löffler, V. Motsch, P. Schattschneider:
    "Optical concepts for mapping atomic orbitals";
    Vortrag: Meeting on Optical Response in Extended Systems, Wien; 14.11.2012 - 16.11.2012.

  65. S. Löffler, M. Stöger-Pollach, A. Steiger-Thirsfeld, J. Hell, J. Verbeeck, P. Schattschneider:
    "Electron vortex beams: a novel probe for nano-analysis";
    Vortrag: 2nd ASEM - Workshop, Salzburg, Österreich; 26.04.2012 - 27.04.2012.

  66. V. Mauchamp, M. Jaouen, J.J. Rehr, J. Kas, M. Bugnet, J. Vinson, P. Schattschneider, T. Cabioc´H:
    "Les effets d'excitation en EELS: de l'équation de Bethe-Salpeter á l#approximation monoélectronique";
    Vortrag: JEELS, Lausanne, Schweiz; 19.01.2011 - 21.01.2011.

  67. V. Mauchamp, M. Jaouen, P. Schattschneider:
    "Core-hole effect in the one-particle approximation revisited from Density Functional Theory";
    Vortrag: International EELS Workshop, Banff, Alberta/ Canada; 17.05.2009 - 22.05.2009.

  68. A. Montgermont, M. Stöger-Pollach, P. Schattschneider:
    "Thin film growth in ALILE";
    Vortrag: Vortrag bei Meteor-Workshop, IMEC, Leuven, Belgien; 07.10.2004 - 08.10.2004.

  69. V. Motsch, S. Löffler, W. Hetaba, P. Schattschneider:
    "Simulating HR-EFTEM images";
    Vortrag: 2nd ASEM - Workshop, Salzburg, Österreich; 26.04.2012 - 27.04.2012.

  70. K. Müller, F. Krause, A. Béché, M. Schowalter, V. Galioit, S. Löffler, J. Verbeeck, J. Zweck, P. Schattschneider, A. Rosenauer:
    "A Quantum Mechanical Approach to Electron Picodiffraction Reveals Atomic Electric Fields";
    Vortrag: 2015 MRS Spring Meeting & Exhibit, San Francisco; 06.04.2015 - 10.04.2015.

  71. K. Müller, F. Krause, A. Béché, M. Schowalter, V. Galioit, S. Löffler, J. Verbeeck, J. Zweck, P. Schattschneider, A. Rosenauer:
    "Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields";
    Vortrag: Microscopy of Semiconducting Materials (MSM-XIX), Cambridge; 29.03.2015 - 02.04.2015.

    Zusätzliche Informationen

  72. K. Müller-Caspary, M. Duchamp, F. Krause, A. Béché, F. Winkler, S. Löffler, H. Soltau, J. Zweck, P. Schattschneider, J. Verbeeck et al.:
    "Mapping atomic electric fields and charge densities by four-dimensional STEM";
    Vortrag: 24th Congress and General Assembly of the International Union of Crystallography, Hyderabad, Indien (eingeladen); 21.08.2017 - 28.08.2017.

    Zusätzliche Informationen

  73. K. Müller-Caspary, F. Krause, A. Béché, M. Schowalter, V. Galioit, S. Löffler, O. Oppermann, T. Grieb, A. Oelsner, P.L. Potapov, J. Verbeeck, J. Zweck, P. Schattschneider, A. Rosenauer:
    "Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields";
    Vortrag: FEMMS 2015 (Frontiers of Electron Microscopy in Materials Science), Granlibakken Conference Center & Lodge Tahoe City, California, USA; 13.09.2015 - 18.09.2015.

  74. L. Pardini, S. Löffler, G. Biddau, R. Hambach, U. Kaiser, C. Draxl, P. Schattschneider:
    "Mapping atomic orbitals in the transmission electronic microscope: seeing defects in graphene";
    Vortrag: 79th Annual Meeting of the DPG and Spring Meeting of the Condensed Matter Section, Berlin; 15.03.2015 - 20.03.2015.

    Zusätzliche Informationen

  75. C. Petot, G. Petot-Ervas, J. Kusinski, B. Jouffrey, P. Schattschneider:
    "Electrical conductivity and microstructural characterization of Ca-doped cobaltous oxide";
    Vortrag: 104th annual meeting of the Am. Cer. Soc., St. Louis, USA; 28.04.2002 - 01.05.2002.

  76. K. Petter, D. Eyidi, M. Stöger-Pollach, I. Sieber, P. Schubert-Bischoff, B. Rau, A.T. Tham, P. Schattschneider, S. Gall, K. Lips, W. Fuhs:
    "Line defects in epitaxial silicon films grown at 560°C";
    Poster: The 23rd International Conference on Defects in Semiconductors, Awaji Island/ Japan; 24.07.2005 - 29.07.2005.

  77. D. Pohl, J. Rusz, S. Schneider, S. Löffler, P. Schattschneider, B. Rellinghaus:
    "Electron Vortex Beams Prepared by Spiral Apertures for Magnetic Measurements on Ferromagnetic Samples via STEM";
    Vortrag: 2015 MRS Spring Meeting & Exhibit, San Francisco; 06.04.2015 - 10.04.2015.

  78. D. Pohl, S. Schneider, J. Rusz, J. Spiegelberg, P. Tiemeijer, S. Löffler, P. Schattschneider, B. Rellinghaus:
    "Electron vortex beams for magnetic measurements on ferromagnetic samples via STEM";
    Vortrag: Microscopy and Microanalysis 2015 Meeting, Portland, Oregon, USA; 02.08.2015 - 06.08.2015.

  79. P. L. Potapov, H. Lichte, J. Verbeeck, D. Van Dyck, P. Schattschneider:
    "Coherence of inelastic scattering near the edge of a sample";
    Poster: International EELS Workshop, Grundlsee; 01.05.2005 - 05.05.2005.

  80. P. Potapov, H. Lichte, J. Verbeeck, D. Van Dyck, P. Schattschneider:
    "Point-to-point coherence in inelastic scattering";
    Vortrag: 13th European Microscopy Congress EMC 2004, Antwerpen, Belgien; 22.08.2004 - 27.08.2004.

  81. B. Rau, J. Klein, J. Schneider, I. Sieber, S. Gall, M. Stöger-Pollach, P. Schattschneider, W. Fuhs:
    "Poly-crystalline Si thin-film solar cells on glass: Low-temperature epitaxial thickening of seed layers";
    Vortrag: 69. Jahrestagung der Deutschen Physikalischen Gesellschaft (DPG), Berlin/ Deutschland; 04.03.2005 - 09.03.2005.

  82. B. Rau, K. Petter, I. Sieber, M. Stöger-Pollach, D. Eyidi, P. Schattschneider, S. Gall, K. Lips, W. Fuhs:
    "Extended defects in Si films epitaxially grown by low-temperature ECRCVD";
    Vortrag: 16th American Conference on Crystal Growth and Epitaxy, Big Sky, Montana/ USA; 10.07.2005 - 15.07.2005.

  83. B. Rau, J. Schneider, J. Klein, M. Muske, I. Sieber, M. Stöger-Pollach, P. Schattschneider, S. Gall:
    "Epitaxial growth of Silicon by low-temperature ECRCVD for Si thin film solar cells on glass substrates";
    Poster: Hahn-Meitner-Institut Klausurtagung 2004, Brandenburg, Deutschland; 19.01.2004 - 21.01.2004.

  84. B. Rau, J. Schneider, M. Muske, I. Sieber, S. Gall, M. Stöger-Pollach, P. Schattschneider, W. Fuhs:
    "Epitaxial Si Growth on Polycrystalline Si seed layers at Low Temperature";
    Vortrag: 19th European Photovoltaic Solar Energy Conference, Paris, Frankreich; 07.06.2004 - 11.06.2004.

  85. B. Rau, B. Selle, U. Knipper, S. Brehme, I. Sieber, M. Stöger-Pollach, P. Schattschneider, S. Gall, W. Fuhs:
    "Low-Temperature Epitaxial Si Absorber Layers Grown by Electron-Cyclotron Resonance Chemical Vapor Deposition";
    Poster: 3rd World Conference on Photovoltaic Energy Conversion, Osaka, Japan; 11.05.2003 - 18.05.2003.

  86. S. Rubino, P. Schattschneider, J. Verbeeck, K. Leifer:
    "Observation of magnetic dichroism in the electron microscope";
    Vortrag: 7th International Conference on Fine Particle Magnetism (ICFPM-07), Uppsala; Sweden (eingeladen); 21.06.2010 - 24.06.2010.

  87. St. Rubino, C. Hébert, P. Schattschneider:
    "Circular dichroic imaging in the TEM";
    Poster: 3rd Chiraltem Workshop, Trieste, Italien; 31.05.2007 - 01.06.2007.

  88. St. Rubino, C. Hébert, P. Schattschneider:
    "First evidence for circular dichroism in Transmission Electron Microscopy";
    Poster: Microscopy Conference MC 2003, Dresden, Deutschland; 07.09.2003 - 12.09.2003.

  89. St. Rubino, C. Hébert, M. Stöger-Pollach, P. Schattschneider, C. Prioul, A. Phelippeau:
    "Lattice site dependence of carbon K-ELNES in steel";
    Vortrag: 13th European Microscopy Congress EMC 2004, Antwerpen, Belgien; 22.08.2004 - 27.08.2004.

  90. St. Rubino, S. Jafri, T. Blom, K. Carva, B. Sanyal, O. Eriksson, E. Widenkvist, U. Jansson, H. Grennberg, R. Quinlan, J. Rusz, P. Oppeneer, B. Hjörvarsson, A. Liebig, P. Schattschneider, M. Stöger-Pollach, C. Hurm, J. Zweck, K. Leifer:
    "In-situ contacting of nanosheets and remote EMCD";
    Vortrag: 2nd International Workshop on remote Electron Microscopy and In Situ Studies, Gothenburg, Sweden; 16.11.2009 - 18.11.2009.

  91. St. Rubino, J. Rusz, P. Schattschneider:
    "Detection of Magnetic Circular Dichroism using TEM and EELS";
    Vortrag: Electron Crystallography, Erice, Italien (eingeladen); 02.06.2011 - 12.06.2011.

  92. St. Rubino, P. Schattschneider, E. Carlino, M. Fabrizioli, F. Macherozzi:
    "P-FKP38: The CHIRALTEM Project: XMCD without a Synchrotron";
    Poster: 55. Jahrestagung der Österreichischen Physikalischen Gesellschaft, Wien; 27.09.2005 - 29.09.2005.

  93. St. Rubino, P. Schattschneider, E. Carlino, G. Rossi, M. Fabrizioli, F. Macherozzi:
    "The CHIRALTEM Project: XMCD without a Synchrotron";
    Vortrag: 6. Dreiländertagung 2005, Davos/ Schweiz; 28.08.2005 - 02.09.2005.

  94. St. Rubino, P. Schattschneider, C. Hébert:
    "TEM experiments on Circular Dichroism in Nickel";
    Poster: 13th European Microscopy Congress EMC 2004, Antwerpen, Belgien; 22.08.2004 - 27.08.2004.

  95. St. Rubino, P. Schattschneider, C. Hébert, P.A. van Aken:
    "Simulations of channelling enhanced spectroscopy of oxygen in Ringwoodite";
    Poster: International EELS Workshop, Grundlsee; 01.05.2005 - 05.05.2005.

  96. St. Rubino, M. Stöger-Pollach, C. Hébert, P. Schattschneider:
    "State of the art of EMCD techniques";
    Vortrag: 3rd Chiraltem Workshop, Trieste, Italien; 31.05.2007 - 01.06.2007.

  97. St. Rubino, M. Stöger-Pollach, C. Hébert, P. Schattschneider, J. Rusz, P. Novák:
    "Energy Loss Magnetic Chiral Dichroism: theory and experiments";
    Vortrag: 71st Annual Meeting 2007, Regensburg, Deutschland; 26.03.2007 - 30.03.2007.

  98. St. Rubino, M. Stöger-Pollach, P. Schattschneider, C. Hébert, F. Houdellier, C. Hurm, J. Zweck:
    "A New Technique for Nanoscale Magnetism";
    Vortrag: MRS Fall Meeting 2007, Boston, USA; 26.11.2007 - 30.11.2007.

  99. J. Rusz, P. Novák, St. Rubino, C. Hébert, P. Schattschneider:
    "Magnetic Circular Dichroism in Electron Microscopy";
    Vortrag: 13th Czech and Slovak Conference on Magnetism - CSMAG'07, Kosice, Slovakia (eingeladen); 09.07.2007 - 12.07.2007.

  100. A. Satz, C. Hébert, C. Eisenmenger-Sittner, P. Schattschneider:
    "P-FKP41: Lifetime of Hot Electrons in Palladium";
    Poster: 55. Jahrestagung der Österreichischen Physikalischen Gesellschaft, Wien; 27.09.2005 - 29.09.2005.

  101. T. Schachinger, S. Löffler, P. Schattschneider:
    "Exploring the possibilities and limitations of vortex filter EMCD";
    Vortrag: Electron Microscopy at High Temporal Resolution, Strassburg, Frankreich; 29.05.2017 - 31.05.2017.

  102. T. Schachinger, S. Löffler, P. Schattschneider:
    "Numerical simulations of classical 200keV electrons passing atomic magnetostatic dipoles";
    Vortrag: 2nd ASEM - Workshop, Salzburg, Österreich; 26.04.2012 - 27.04.2012.

  103. T. Schachinger, S. Löffler, P. Schattschneider:
    "Vortex filter EMCD: Possibilities and limitations";
    Poster: PICO 2017 - Frontiers of aberration corrected electron microscopy conference and colloquium honouring Robert Sinclair & Nestor Zaluzec, Kasteel Vaalsbroek, NL; 30.04.2017 - 04.05.2017.

  104. T. Schachinger, S. Löffler, A. Steiger-Thirsfeld, P. Schattschneider:
    "Vorticity filtering for magnetic dichroism measurements with nanometre spatial resolution";
    Poster: DOC-ÖAW-Verleihung, Wien (eingeladen); 09.06.2017.

  105. T. Schachinger, S. Löffler, A. Steiger-Thirsfeld, M. Stöger-Pollach, P. Schattschneider:
    "Vortex Filter EMCD: Towards an Alternative EMCD Approach";
    Poster: 7th ASEM-Workshop - Advanced Electron Microscopy, Wien; 20.04.2017 - 21.04.2017.

  106. T. Schachinger, S. Löffler, M. Stöger-Pollach, A. Steiger-Thirsfeld, P. Schattschneider:
    "Influences of the objective lens on electron vortices";
    Vortrag: 3rd ASEM-Workshop on Advanced Electron Microscopy, Medical University of Vienna; 25.04.2013 - 26.04.2013.

  107. T. Schachinger, P. Schattschneider, S. Löffler, M. Stöger-Pollach, A. Steiger-Thirsfeld, K. Bliokh, F. Nori:
    "Electron Vortex Beams in Magnetic Fields: Imaging Peculiar Rotations and Landau States";
    Poster: CCEM Summer School, McMaster University, Hamilton, Canada; 02.06.2014 - 06.06.2014.

  108. T. Schachinger, A. Steiger-Thirsfeld, S. Löffler, M. Stöger-Pollach, P. Schattschneider:
    "Holographic Vortex Filter Masks in the TEM: A new approach to EMCD?";
    Vortrag: 6th ASEM Workshop, Leoben; 28.04.2016 - 29.04.2016.

  109. T. Schachinger, A. Steiger-Thirsfeld, S. Löffler, M. Stöger-Pollach, P. Schattschneider, S. Schneider, D. Pohl, B. Rellinghaus:
    "Preparation of holographic vortex masks for EMCD vortex filter experiments using advanced FIB milling strategies";
    Poster: IFEXS, Triest; 01.02.2016 - 03.02.2016.

  110. T. Schachinger, A. Steiger-Thirsfeld, M. Stöger-Pollach, P. Schattschneider:
    "Generation of Bessel Beams with Extremely High Orbital Angular Momentum";
    Vortrag: 5th ASEM Workshop on Advanced Electron Microscopy, Medical University Graz; 07.05.2015 - 08.05.2015.

  111. T. Schachinger, A. Steiger-Thirsfeld, M. Stöger-Pollach, P. Schattschneider:
    "Generation of Massively Twisted Electron Vortex Beams in a TEM";
    Vortrag: Joint Annual Meeting of ÖPG,SPS,ÖGAA,SGAA, TU Wien; 03.09.2015.

  112. P. Schattschneider:
    "A new holographic technique: Chiral Dichroism in the TEM";
    Vortrag: 2nd European Workshop on Electron Holography, Dresden, Germany; 30.09.2004.

  113. P. Schattschneider:
    "A new technique for the study of magnetic properties in the electron microscope";
    Vortrag: 52nd Annual Conference on Magnetism and Magnetic Materials (MMM 2007), Tampa, Florida (eingeladen); 05.11.2007 - 09.11.2007.

  114. P. Schattschneider:
    "Applications of inelastic scattering in the electron microscope";
    Vortrag: Pozvánka na Katedrální Seminár, Seminár Fyziky Kovû, Prag, Tschechische Republik (eingeladen); 11.12.2003.

  115. P. Schattschneider:
    "Channeling, localization and the density matrix in inelastic electron scattering";
    Vortrag: Strategies and advances in Atomic Level Spectroscopy and Analysis, Guadeloupe, French West Indies; 05.05.2002 - 09.05.2002.

  116. P. Schattschneider:
    "Chiral dichroism in the TEM A proposal";
    Vortrag: Gruppenseminar Triebenberg-Labor, Dresden, Deutschland (eingeladen); 04.12.2003.

  117. P. Schattschneider:
    "Circular dichroism in the electron microscope: Principle and progress";
    Vortrag: Seminar, University of Münster (eingeladen); 14.10.2010.

  118. P. Schattschneider:
    "Circular Dichroism in the TEM: Principle and First Results";
    Vortrag: Seminar LEM, ONERA, Paris/ Frankreich (eingeladen); 24.11.2005.

  119. P. Schattschneider:
    "Coherence and correlation in EELS and EFTEM";
    Vortrag: Seminar Univ. Dresden, Dresden, Deutschland (eingeladen); 04.12.2003.

  120. P. Schattschneider:
    "Coherence and correlation in EELS and EFTEM";
    Vortrag: 2nd European Workshop on Electron Holography, Dresden, Germany (eingeladen); 29.09.2004.

  121. P. Schattschneider:
    "Coherence in EELS: the essential ingredient for spin and site sensitivity";
    Vortrag: FEMMS 2015 (Frontiers of Electron Microscopy in Materials Science), Granlibakken Conference Center & Lodge Tahoe City, California, USA (eingeladen); 13.09.2015 - 18.09.2015.

  122. P. Schattschneider:
    "Dichroism with electrons in TEM";
    Vortrag: 19. Edgar Lüscher Seminar 2008, Klosters, Schweiz (eingeladen); 16.02.2008 - 21.02.2008.

  123. P. Schattschneider:
    "EELS in the TEM: Basis and applications";
    Vortrag: MORE Symposium, Vienna, Austria (eingeladen); 19.11.2008 - 21.11.2008.

  124. P. Schattschneider:
    "EELS. My Life in Science";
    Hauptvortrag: EELS. My Life in Science, Wien (eingeladen); 13.11.2015 - 14.11.2015.

  125. P. Schattschneider:
    "Electron energy loss spectrometry (EELS) in the TEM: Basics and Applications";
    Vortrag: VJornadas do Ciceco, Aveiro, Portugal (eingeladen); 24.01.2008 - 25.01.2008.

  126. P. Schattschneider:
    "Electrons with a twist: Chirality and Vorticity in Electron Microscopy";
    Vortrag: 2012 MRS Fall Meeting & Exhibit, Hynes Convention Center, Boston, USA (eingeladen); 25.11.2012 - 30.11.2012.

  127. P. Schattschneider:
    "Electrons with a twist: Dichroism and vorticity in the TEM";
    Vortrag: Internationaler Workshop EELS in materials science, Uppsala, Sweden (eingeladen); 18.06.2012 - 20.06.2012.

  128. P. Schattschneider:
    "Electrons with a twist: EMCD and vortex beams";
    Vortrag: Seminar des Instituts für Festkörperphysik (IFP), TU Wien (eingeladen); 01.12.2010.

  129. P. Schattschneider:
    "Electrons with a twist: Vorticity and chirality in the electron microscope";
    Vortrag: Pozvánka na prednásku, Tschechische Akademie der Wissenschaften, Brünn (eingeladen); 16.07.2013.

  130. P. Schattschneider:
    "Electrons with Topological Charge";
    Vortrag: Gutenberg Universität Mainz, Mainz, Deutschland; 05.11.2014 - 07.11.2014.

  131. P. Schattschneider:
    "Electrons with Topological Charge - a Novel Probe for Solids";
    Vortrag: Institut de Sciences Moléculaires d'Orsay, Orsay, Frankreich; 29.09.2014 - 08.10.2014.

  132. P. Schattschneider:
    "EMCD - Magnetic Chiral Dichroism in the Electron Microscope";
    Vortrag: stAR-M, Stuttgart (eingeladen); 16.12.2014.

  133. P. Schattschneider:
    "EMCD: A New Technique for the Study of Magnetic Properties in the Electron Microscope";
    Vortrag: Laboratoire de Metallurgie Physique, Universite de Poiteiers, Cedex, Frankreich (eingeladen); 03.07.2007.

  134. P. Schattschneider:
    "EMCD: Magnetic Circular Dichroism in the Electron Microscope";
    Vortrag: Stuttgarter Physikalisches Kolloquium, Max Planck Institute für Festkörper- und Metallforschung (eingeladen); 17.04.2007.

  135. P. Schattschneider:
    "Energiespektrometrie im Elektronenmikroskop: von der chemischen Analyse zur elektronischen Struktur im Nanometerbereich";
    Vortrag: Seminar "Moderne Analytische Chemie", Instiut für Chemische Technologien und Analystik, TU Wien, Vienna, Austria (eingeladen); 23.06.2006.

  136. P. Schattschneider:
    "Energieverlustspektrometrie - Ein Fortsetzungsroman";
    Vortrag: Zeitler - Symposium, Berlin, Fritz-Haber-Institut der Max-Planck-Gesellschaft (eingeladen); 04.04.2012.

  137. P. Schattschneider:
    "Energy Loss Spectrometry - a Survey of Applications and the Physics Behind";
    Vortrag: Laboratorio TASC-INFM, Triest, Italien (eingeladen); 26.02.2003.

  138. P. Schattschneider:
    "Energy loss spectrometry in the TEM - well known and other applications";
    Vortrag: Seminarvortrag, Regensburg, Deutschland (eingeladen); 08.07.2003.

  139. P. Schattschneider:
    "Energy loss spectrometry in the TEM - well known and other applications";
    Vortrag: Seminarvortrag, Regensburg, Germany (eingeladen); 08.07.2003.

  140. P. Schattschneider:
    "Experimental low-loss EELS";
    Vortrag: International Workshop on "New Trends in Electron Microscopy", Max Planck Institute for Metals Research, Stuttgart, Deutschland (eingeladen); 07.03.2007 - 09.03.2007.

  141. P. Schattschneider:
    "Frontiers in EELS, and how they change";
    Vortrag: Frontiers in EELS, TU Wien (eingeladen); 11.03.2010 - 12.03.2010.

  142. P. Schattschneider:
    "Frontiers in Energy Loss Spectrometry";
    Vortrag: Seminarvortrag, Ecole Central Paris, Frankreich (eingeladen); 08.03.2012.

  143. P. Schattschneider:
    "Hard Science Fiction - Gedankenspiel zum Nachrechnen";
    Vortrag: Monat der freien Bildung, Resselpark, Wien; 27.05.2014.

  144. P. Schattschneider:
    "Highlights in Energy Loss Spectrometry: Memories of the Future";
    Vortrag: Inauguration Microscopie, Paris, France (eingeladen); 10.12.2014.

  145. P. Schattschneider:
    "How Physics Inspires Science Fiction";
    Vortrag: School of Physics - SEMINAR, The University of Melbourne, Melbourne, Australien (eingeladen); 28.02.2006.

  146. P. Schattschneider:
    "Inelastic coherence and spin polarized transitions";
    Vortrag: Minisymposium on Inelastic Coherence and Holography, Dresden/ Deutschland (eingeladen); 05.04.2009 - 07.04.2009.

  147. P. Schattschneider:
    "Inelastic electron scattering and the density matrix";
    Vortrag: Seminarvortrag, Antwerpen, Belgien (eingeladen); 23.04.2004.

  148. P. Schattschneider:
    "Inelastic Interference in TEM: Plasmons and Ionization Edges";
    Vortrag: Seminarvortrag, TU Graz; 16.12.2002.

  149. P. Schattschneider:
    "Interferenz in EELS und EFTEM - Bedeutung und Anwendung des MDFF";
    Vortrag: Arbeitskreis EF-EELS, Stuttgart, Deutschland (eingeladen); 25.09.2002 - 27.09.2002.

  150. P. Schattschneider:
    "Interferometric electron energy loss spectrometry";
    Vortrag: LESS 2009, Wien/ Österreich (eingeladen); 11.11.2009 - 13.11.2009.

  151. P. Schattschneider:
    "Introduction to EELS and EFTEM";
    Vortrag: Workshop EELS/EFTEM Arbeitskreistreffen Energiefilterung, Fédérale de Lausanne, Switzerland (eingeladen); 29.09.2004 - 01.10.2004.

  152. P. Schattschneider:
    "LA SCIENCE FICTION une approche romanesque de la Mécanique et de la Physique";
    Vortrag: Seminarvortrag Laboratoire MSSMat, Ecole Centrale Paris (eingeladen); 06.04.2004.

  153. P. Schattschneider:
    "Localisation and Correlation in Low Energy Losses";
    Poster: 6th Multinational Congress on Microscopy - European Extension, Pula, Coratia; 01.06.2003 - 05.06.2003.

  154. P. Schattschneider:
    "Low-loss EELS";
    Vortrag: Low Energy Spectrometry Symposium, Verein der Freunde der Festkörperphysik und -chemie, Wien, Austria (eingeladen); 18.01.2007 - 19.01.2007.

  155. P. Schattschneider:
    "Magnetic circular dichroism in electron microscopy";
    Vortrag: Seminar, University of Bielefeld (eingeladen); 11.10.2010.

  156. P. Schattschneider:
    "Magnetic Circular Dichroism in the Electron Microscope";
    Vortrag: MONASH Centre for Electron Microscopy - SEMINAR, MONASH University, Melbourne, Australien (eingeladen); 17.02.2006.

  157. P. Schattschneider:
    "Magnetic Circular Dichroism in the Electron Microscope - A new technique for nanomagnetism";
    Vortrag: Chiraltem, TU Wien, Vienna, Austria (eingeladen); 21.05.2007.

  158. P. Schattschneider:
    "Materials Science & Technology Division";
    Vortrag: Seminar Coherence and Correlation in EELS and EFTEM, Oak Ridge, Tennessee, USA (eingeladen); 20.11.2007.

  159. P. Schattschneider:
    "New dichroic experiments in the TEM The CHIRALTEM collaboration";
    Vortrag: Seminar CEMES, Toulouse/ Frankreich (eingeladen); 19.04.2005.

  160. P. Schattschneider:
    "News about EMCD - Dichroism in the (S)TEM";
    Vortrag: PICO 2015 - 3rd Conference on Frontiers of Aberration Corrected Electron Microscopy, Kasteel Vaalsbroek, The Netherlands (eingeladen); 19.04.2015 - 23.04.2015.

    Zusätzliche Informationen

  161. P. Schattschneider:
    "Principles of energy loss chiral dichroism in the tem";
    Vortrag: FEMMS 2005, Kasteel Vaalsbroek/ Niederlande (eingeladen); 25.09.2005 - 30.09.2005.

  162. P. Schattschneider:
    "Science Fiction zwischen Wissenschaft und Prognostik";
    Vortrag: Österreich liest, Tu Wien, Österreich (eingeladen); 17.10.2011 - 21.10.2011.

  163. P. Schattschneider:
    "Science Fiction-Literatur und die Naturwissenschaften";
    Vortrag: Österreichische Gesellschaft für Literatur, Wien (eingeladen); 08.11.2010.

  164. P. Schattschneider:
    "Science und Fiction: Ein Bericht über eine Beziehung";
    Vortrag: Die Welt des Hirns - Das Hirn der Welt. Wissenschafer und Science-Fiction Autoren im Dialog., Basel (eingeladen); 29.05.2010.

  165. P. Schattschneider:
    "Sience Fiction an der Alma Mater";
    Vortrag: Österreich liest, Treffpunkt Bibliothek, TU Wien (eingeladen); 15.10.2012 - 19.10.2012.

  166. P. Schattschneider:
    "Some applications of EELS in the diffraction plane";
    Vortrag: FEI FEG-TEM User Meeting, Aachen, Deutschland (eingeladen); 04.11.2003.

  167. P. Schattschneider:
    "The Electron Mircoscopy Facility at Vienna University of Technology";
    Vortrag: Austrian/French Bilateral Seminar, Wien, Österreich (eingeladen); 27.03.2003 - 28.03.2003.

  168. P. Schattschneider:
    "The HR-MDFF - a timely proposal";
    Vortrag: PICO 2015, Vaalsbroek (eingeladen); 19.04.2015 - 23.04.2015.

  169. P. Schattschneider:
    "The present state of EMCD";
    Vortrag: Laboratoire de Physique des Solides, Universite Paris-Sud, Paris, Frankreich (eingeladen); 23.02.2007.

  170. P. Schattschneider:
    "Un siècle de pertes d'énergie";
    Vortrag: Seminar, Ecole Centrale Paris (eingeladen); 22.04.2010.

  171. P. Schattschneider:
    "Understanding Physics: the spirit of Science Fiction";
    Vortrag: Seminar CEMES, Toulouse, France (eingeladen); 24.09.2008.

  172. P. Schattschneider:
    "Understanding Physics: The spirit of Science Fiction";
    Vortrag: Seminar, University of Ulm (eingeladen); 19.07.2010.

  173. P. Schattschneider:
    "XMCD in the electron microscope: Nanometer resolution and below";
    Vortrag: Séminaire Soleil, Saint-Aubin, France (eingeladen); 19.09.2008.

  174. P. Schattschneider, J. Bernardi, D. Eyidi, C. Hébert, F. Hofer, B. Jouffrey, M. Nelhiebel, St. Rubino, M. Stöger-Pollach, M.-G. Willinger:
    "Fundamentals of EELS";
    Vortrag: Seminar an der ETH Zürich, Schweiz (eingeladen); 09.09.2005.

  175. P. Schattschneider, A. Bleloch, E. Carlino, C. Hébert, J. Mayer, M. Nelhiebel, St. Rubino, J. Rusz, O. Stephan, M. Stöger-Pollach et al.:
    "Dichroism and other actual topics in EELS";
    Vortrag: 19. Edgar Lüscher Seminar 2008, Klosters, Schweiz (eingeladen); 16.02.2008 - 21.02.2008.

  176. P. Schattschneider, E. Carlino, H. Lichte, P. Novák, J. Zweck, C. Hébert, J. Bernardi:
    "CHIRALTEM - circular dichroism in the TEM";
    Vortrag: 13th European Microscopy Congress EMC 2004, Antwerpen, Belgien; 22.08.2004 - 27.08.2004.

  177. P. Schattschneider, E. Carlino, H. Lichte, J. Zweck, P. Novák:
    "High resolution Magnetic Circular Dichroism in the Electron Microscope";
    Vortrag: Spectroscopies d'electrons et diffusion inelastique en matiere condensee : vers une meilleure comprehension des effets de correlation, Saint-Aubain/ Frankreich (eingeladen); 03.11.2005 - 04.11.2005.

  178. P. Schattschneider, C. Hébert:
    "Elnes: The Basic Principles";
    Vortrag: PICS 913, Challenges in ELNES, Paris, Frankreich; 26.11.2002 - 27.11.2002.

  179. P. Schattschneider, C. Hébert:
    "Energy Loss Spectrometry - Present and Future Applications";
    Vortrag: EUROMAT 2003, Lausanne, Switzerland (eingeladen); 01.09.2003 - 05.09.2003.

  180. P. Schattschneider, C. Hébert, B. Jouffrey:
    "Localization of Low Energy Losses and the Mixed Dynamic Form Factor ";
    Poster: Microscopy Society of America, Quebec, Canada; 05.08.2002 - 08.08.2002.

  181. P. Schattschneider, C. Hébert, B. Jouffrey:
    "The magic angle: a solved mystery";
    Poster: Workshop EELS/EFTEM Arbeitskreistrefeen Energiefilterung, Fédérale de Lausanne, Swizerland; 29.09.2004 - 01.10.2004.

  182. P. Schattschneider, C. Hébert, St. Rubino, M. Stöger-Pollach:
    "The principle of EMCD";
    Vortrag: 3rd Chiraltem Workshop, Trieste, Italien; 31.05.2007 - 01.06.2007.

  183. P. Schattschneider, C. Hébert, St. Rubino, M. Stöger-Pollach, F. Houdellier, B. Warot-Fonrose, V. Serin, J. Rusz, P. Novák:
    "Approaching 10 nm Resolution with Energy Loss Magnetic Chiral Dichroism (EMCD)";
    Vortrag: EUROMAT 2007, Nürnberg, Germany; 10.09.2007 - 13.09.2007.

    Zusätzliche Informationen

  184. P. Schattschneider, B. Jouffrey:
    "Energy Loss Spectrometry and Eftem - The Present Situation and Things to come";
    Vortrag: 6th Multinational Congress on Microscopy - European Extension, Pula, Croatia (eingeladen); 01.06.2003 - 05.06.2003.

  185. P. Schattschneider, B. Jouffrey:
    "Experimental Evidence for a Localized Collective Mode";
    Vortrag: 15th International Congress on Electron Microscopy, Durban, South Africa; 01.09.2002 - 06.09.2002.

  186. P. Schattschneider, B. Jouffrey:
    "Inelastic Interference Experiments";
    Vortrag: PICS 913, Challenges in ELNES, Pairs, Frankreich; 26.11.2002 - 27.11.2002.

  187. P. Schattschneider, B. Jouffrey:
    "Localization and Correlation of Band Transitions from Electron Energy Loss Spectrometry";
    Vortrag: EUROMAT 2003, Lausanne, Schweiz; 01.09.2003 - 05.09.2003.

  188. P. Schattschneider, B. Jouffrey, N. Vast, L. Reining:
    "Plasmon Dispersion in Rutile";
    Poster: 15th International Congress on Electron Microscopy, Durban, South Africa; 01.09.2002 - 06.09.2002.

  189. P. Schattschneider, S. Löffler:
    "Coherence and Resolution in EELS";
    Vortrag: CCEM Summer School on Electron Microscopy, McMaster University, Kanada (eingeladen); 05.06.2017 - 09.06.2017.

  190. P. Schattschneider, S. Löffler, T. Schachinger:
    "Electron vortex microscopy for local spin and orbital moments";
    Vortrag: 620. WE-Heraeus-Seminar, Bad Honnef, D (eingeladen); 19.06.2016 - 23.06.2016.

  191. P. Schattschneider, S. Löffler, M. Stöger-Pollach, K. Bliokh, J. Verbeeck:
    "Electron Vortices: A Novel Probe for Electron Microscopy";
    Vortrag: 10th Asia-Pacific Microscopy Conference, ICONN 2012, ACMM 22, Perth, Western Australia (eingeladen); 05.02.2012 - 09.02.2012.

    Zusätzliche Informationen

  192. P. Schattschneider, St. Rubino, C. Hébert:
    "Circular Dichroic imaging in the TEM";
    Poster: International Workshop Magnetic Imaging, Bochum/ Deutschland; 05.12.2005 - 06.12.2005.

  193. P. Schattschneider, St. Rubino, C. Hébert:
    "Observation of Circular Dichroism in the TEM";
    Vortrag: Microscopy and Microanalysis, Savannah, Georgia, USA (eingeladen); 01.08.2004 - 05.08.2004.

  194. P. Schattschneider, St. Rubino, C. Hébert:
    "TEM experiments on circular dichroism";
    Poster: Workshop EELS/EFTEM Arbeitskreistrefeen Energiefilterung, Fédérale de Lausanne, Swizerland; 29.09.2004 - 01.10.2004.

  195. P. Schattschneider, St. Rubino, C. Hébert:
    "The Principle of CHIRALTEM";
    Vortrag: 2. CHIRALTEM Workshop, TU Wien, VIenna, Austria (eingeladen); 18.04.2006 - 20.04.2006.

  196. P. Schattschneider, St. Rubino, C. Hébert, E. Carlino, M. Fabrizioli, P. Formanek, H. Lichte, J. Zweck, C. Hurm, P. Novák, J. Rusz:
    "Circular dichroic experiments with electrons - recent results of the CHIRALTEM project";
    Vortrag: International EELS Workshop, Grundlsee (eingeladen); 01.05.2005 - 05.05.2005.

  197. P. Schattschneider, St. Rubino, C. Hébert, P. Formanek, H. Lichte, C. Hurm, J. Zweck:
    "Chiral dichroism in EELS: a New Analytical Tool";
    Poster: 6. Dreiländertagung 2005, Davos/ Schweiz; 28.08.2005 - 02.09.2005.

  198. P. Schattschneider, St. Rubino, C. Hébert, P. Formanek, H. Lichte, C. Hurm, J. Zweck:
    "Circular Dichroism in the Electron Microscope: First Results";
    Poster: Spectroscopies d'electrons et diffusion inelastique en matiere condensee : vers une meilleure comprehension des effets de correlation, Saint-Aubin/ Frankreich (eingeladen); 03.11.2005 - 04.11.2005.

  199. P. Schattschneider, St. Rubino, M. Stöger-Pollach, C. Hébert, J. Rusz, L. Calmels, B. Warot-Fonrose, F. Houdellier, V. Serin, P. Novák:
    "EMCD: Magnetic Chiral Dichroism in the Electron Microscope";
    Vortrag: MRS Fall Meeting 2007, Boston, USA (eingeladen); 26.11.2007 - 30.11.2007.

  200. P. Schattschneider, T. Schachinger, S. Löffler:
    "Electron vortex microscopy for local spin and orbital moments";
    Vortrag: IFEXS, Triest (eingeladen); 01.02.2016 - 03.02.2016.

  201. P. Schattschneider, M. Stöger-Pollach:
    "Observation of metal induced gap states at a-Si/Al and c-Si/Al interfaces";
    Poster: Microscopy and Microanalysis, Savannah, Georgia, USA; 01.08.2004 - 05.08.2004.

  202. P. Schattschneider, M. Stöger-Pollach, S. Löffler, T. Schachinger, K. Bliokh:
    "Electron Vortices and Energy Loss Spectrometry";
    Vortrag: MSC-SMC 40th Annual Meeting 2013, University of Victoria, Canada (eingeladen); 18.06.2013 - 21.06.2013.

  203. P. Schattschneider, M. Stöger-Pollach, St. Rubino, C. Hébert:
    "XMCD in the electron microscope";
    Vortrag: 23. Workshop on Novel Materials and Superconductivity, Donnersbach, Planneralm (eingeladen); 23.02.2008 - 01.03.2008.

  204. P. Schattschneider, J. Verbeeck:
    "Chiral EELS: Application to magnetic materials";
    Vortrag: International EELS Workshop, Banff, Alberta/ Canada (eingeladen); 17.05.2009 - 22.05.2009.

  205. P. Schattschneider, J. Verbeeck:
    "Electrons with a twist: EMCD and vortex beams";
    Vortrag: Physikalisches Kolloquium, TU Graz (eingeladen); 24.05.2011.

  206. S. Schneider, D. Pohl, S. Löffler, D. Kasinathan, J. Rusz, P. Schattschneider, L. Schultz, B. Rellinghaus:
    "Quantifying magnetism on the nanometer scale: EMCD on individual FePt nanoparticles";
    Vortrag: 620. WE-Heraeus-Seminar, Bad Honnef, D; 19.06.2016 - 23.06.2016.

  207. S. Schneider, D. Pohl, S. Löffler, D. Kasinathan, J. Rusz, P. Schattschneider, L. Schultz, B. Rellinghaus:
    "Quantifying Magnetism on the nm Scale: EMCD on Individual FePt Nanoparticles";
    Vortrag: Microscopy & Microanalysis 2016 Meeting, Columbus, Ohio; 24.07.2016 - 28.07.2016.

  208. S. Schneider, D. Pohl, S. Löffler, T. Schachinger, P. Schattschneider, B. Rellinghaus:
    "Magnetic Properties of Single Nanoparticles: EMCD on FePt Nanocubes";
    Vortrag: 2015 MRS Spring Meeting & Exhibit, San Francisco; 06.04.2015 - 10.04.2015.

  209. S. Schneider, D. Pohl, T. Schachinger, S. Löffler, P. Schattschneider, B. Rellinghaus:
    "Exploring in properties of individual nanomagnets: EMCD on FePt nanocubes";
    Poster: 79th Annual Meeting of the DPG and Spring Meeting of the Condensed Matter Section, Berlin, BRD; 15.03.2015 - 20.03.2015.

    Zusätzliche Informationen

  210. S. Schneider, D. Pohl, T. Schachinger, S. Löffler, P. Schattschneider, B. Rellinghaus:
    "Exploring the properties of individual nanomagnets: EMCD on FePt nanocubes";
    Vortrag: 79th Annual Meeting of the DPG and Spring Meeting of the Condensed Matter Section, Berlin, Deutschland; 25.03.2012 - 30.03.2012.

    Zusätzliche Informationen

  211. V. Serin, F. Houdellier, B. Warot-Fonrose, L. Calmels, M. Stöger-Pollach, C. Hébert, St. Rubino, P. Schattschneider, J. Rusz, P. Novak, M. Hytch, E. Snoeck:
    "State of the art in energy loss magnetic chiral dichroism (EMCD)";
    Vortrag: MM 2007, Fort Lauderdale, Florida, USA; 05.08.2007 - 09.08.2007.

  212. V. Serin, F. Houdellier, B. Warot-Fonrose, L. Calmels, M. Stöger-Pollach, C. Hébert, St. Rubino, P. Schattschneider, J. Rusz, P. Novák, M.J. Hytch, E. Snoeck:
    "State of the Art in Energy Loss Magnetic Chiral Dichroism (EMCD)";
    Vortrag: Microscopy & Microanalysis 2007 Meeting, Ft Lauderdale, Florida; 05.08.2007 - 09.08.2007.

  213. W. Sigle, S. Löffler, P. Schattschneider:
    "Sub-5 meV precision in plasmon mapping";
    Vortrag: Microscopy Conference MC 2011, Kiel, Deutschland; 28.08.2011 - 02.09.2011.

  214. M. Stöger-Pollach, A. Breymesser, P. Schattschneider:
    "Investigation of impurity enrichment and electronic properties of microcrystalline silicon thin films";
    Vortrag: Microscopy of Semiconducting Materials 2001, Oxford, UK; 25.03.2002 - 29.03.2002.

  215. M. Stöger-Pollach, T. Galek, P. Schattschneider:
    "Determination of optical properties and bandgaps by means of EELS";
    Vortrag: Vortrag bei AMD Environmental, Health & Safety, Dresden, BRD (eingeladen); 13.03.2006.

  216. M. Stöger-Pollach, C. Hébert, P. Schattschneider, H.W. Zandbergen:
    "Thickness dependent loss function of Si at 0.14 e V energy resolution";
    Poster: EUROMAT 2003, Lausanne, Schweiz; 01.09.2003 - 05.09.2003.

  217. M. Stöger-Pollach, C. Hébert, P. Schattschneider, H.W. Zandbergen, B. Rau, S. Gall:
    "SUB-eV Core Level Shifts in Si Grain Boundaries and Nanotwins";
    Vortrag: 6th Multinational Congress on Microscopy - European Extension, Pula, Croatia; 01.06.2003 - 05.06.2003.

  218. M. Stöger-Pollach, E.C. Karl-Rückert, C. Hébert, B. Rau, H.W. Zandbergen, P. Schattschneider, S. Gall:
    "Investigations of Core Level States in Epitaxially Grown Si Layers by EELS";
    Poster: Microscopy of Semiconducting Materials, Churchill College Cambridge, Großbritanien; 31.03.2003 - 03.04.2003.

  219. M. Stöger-Pollach, E.C. Karl-Rückert, P. Schattschneider, J. Bernardi:
    "The layer exchange process: First Clues";
    Vortrag: METEOR Meeting, IMEC Leuven, Belgien; 26.06.2003 - 27.06.2003.

  220. M. Stöger-Pollach, A. Laister, P. Schattschneider:
    "The Determination of Optical Properties of Semiconductors Using EELS";
    Poster: MRS Fall Meeting 2007, Boston, USA; 26.11.2007 - 30.11.2007.

  221. M. Stöger-Pollach, S. Lazar, B. Schaffer, P. Schattschneider, H.W. Zandbergen:
    "Cerenkov losses in valence EELS";
    Poster: International EELS Workshop, Grundlsee; 01.05.2005 - 05.05.2005.

  222. M. Stöger-Pollach, St. Rubino, C. Hébert, P. Schattschneider:
    "Improving the intensity in CHIRALTEM experiments";
    Poster: 3rd Chiraltem Workshop, Trieste, Italien; 31.05.2007 - 01.06.2007.

  223. M. Stöger-Pollach, P. Schattschneider:
    "Crystallization of Si";
    Vortrag: METEOR Meeting, Leuven/ Belgien; 20.01.2005 - 21.01.2005.

  224. M. Stöger-Pollach, P. Schattschneider:
    "Defects in epitaxially grown thin films";
    Vortrag: Vortrag bei Projekttreffen, TU Wien; 24.06.2004 - 25.06.2004.

  225. M. Stöger-Pollach, P. Schattschneider:
    "Elnes Separation on CrL2,3-Edges Influence by Oxygen";
    Poster: 15th International Congress on Electron Microscopy, Durban, Soth Africa; 01.09.2002 - 06.09.2002.

  226. M. Stöger-Pollach, P. Schattschneider:
    "Influences on the ALILE process";
    Vortrag: Vortrag bei Projekttreffen, HMI, Berlin; 08.01.2004 - 09.01.2004.

  227. M. Stöger-Pollach, P. Schattschneider:
    "Influences on the ALILE process";
    Vortrag: Vortrag bei Projekttreffen, TU Wien; 24.06.2004 - 25.06.2004.

  228. M. Stöger-Pollach, P. Schattschneider:
    "Metal induced gap states at a c-Si/Al Schottky barrier";
    Poster: 13th European Microscopy Congress EMC 2004, Antwerpen, Belgien; 22.08.2004 - 27.08.2004.

  229. M. Stöger-Pollach, P. Schattschneider:
    "Metal Induced Gap States in Electron Energy Loss Spectra";
    Vortrag: Spectroscopies d'electrons et diffusion inelastique en matiere condensee : vers une meilleure comprehension des effets de correlation, Saint-Aubain/ Frankreich (eingeladen); 03.11.2005 - 04.11.2005.

  230. M. Stöger-Pollach, P. Schattschneider:
    "Observation of MIGS at Schottky barriers";
    Poster: Workshop EELS/EFTEM Arbeitskreistrefeen Energiefilterung, Fédérale de Lausanne, Swizerland; 29.09.2004 - 01.10.2004.

  231. M. Stöger-Pollach, P. Schattschneider:
    "TEM and EELS studies of epitaxial grown thin films";
    Vortrag: Vortrag bei Meteor-Workshop, IMEC, Leuven, Belgien; 07.10.2004 - 08.10.2004.

  232. M. Stöger-Pollach, P. Schattschneider:
    "TEM studies of epitaxial growth";
    Vortrag: Vortrag bei Projekttreffen, HMI, Berlin; 08.01.2004 - 09.01.2004.

  233. M. Stöger-Pollach, P. Schattschneider, J. Bernardi:
    "EELS an Grenzflächen";
    Vortrag: FEG User Meeting, RWTH Aachen, Aachen, BRD; 04.11.2003 - 05.11.2003.

  234. M. Stöger-Pollach, P. Schattschneider, J. Bernardi:
    "Study of epitaxial deposition";
    Vortrag: METEOR Meeting, TU Wien, Österreich; 09.01.2003 - 10.01.2003.

  235. M. Stöger-Pollach, P. Schattschneider, J. Bernardi:
    "Study of metal-induced crystalisation";
    Vortrag: METEOR Meeting, TU Wien, Österreich; 09.01.2003 - 10.01.2003.

  236. M. Stöger-Pollach, P. Schattschneider, J. Bernardi:
    "TEM investigations of EPI and MIC specimens";
    Vortrag: METEOR Meeting, IMEC Leuven, Belgien; 26.06.2003 - 27.06.2003.

  237. M. Stöger-Pollach, P. Schattschneider, D. Eyidi, J. Bernardi, A. Montgermont, T. Walter, T. Galek, K. Bryla:
    "METEOR WP5 - Materials characterization: A complete summary";
    Vortrag: Final METEOR meeting, Leuven/ Belgien; 29.06.2005 - 30.06.2005.

  238. M. Stöger-Pollach, P. Schattschneider, D. Eyidi, T. Walter, T. Galek, H. Winkelmann, C. Eisenmenger-Sittner:
    "METEOR WP5 - Materials characterization: latest results";
    Vortrag: Final METEOR meeting, Leuven/ Belgien; 29.06.2005 - 30.06.2005.

  239. M. Stöger-Pollach, P. Schattschneider, C. Hébert, H.W. Zandbergen:
    "Unexplained Thickness Dependence in the Si Loss Function at 0.14 eV Energy Resolution";
    Poster: 6th Multinational Congress on Microscopy - European Extension, Pula, Croatia; 01.06.2003 - 05.06.2003.

  240. M. Stöger-Pollach, P. Schattschneider, C. Ornaghi:
    "ELNES separation: a method to improve the detection limit of oxides at interfaces";
    Poster: EUROMAT 2003, Lausanne, Schweiz; 01.09.2003 - 05.09.2003.

  241. M. Stöger-Pollach, P. Schattschneider, T. Schachinger:
    "Shaping electron beams for transmission electron microscopy";
    Vortrag: LEE2015 Low Energy Electrons 2015, Schloß Hernstein, Hernstein (eingeladen); 07.09.2015 - 11.09.2015.

  242. M. Stöger-Pollach, P. Schattschneider, J. Schneider, S. Gall:
    "The Elnes Separation Applied to Oxidation states of Interfaces";
    Vortrag: 6th Multinational Congress on Microscopy - European Extension, Pula, Croatia; 01.06.2003 - 05.06.2003.

  243. M. Stöger-Pollach, J. Schneider, H.W. Zandbergen, P. Schattschneider, S. Gall:
    "Investigations of Bonding at an Aluminium (III) Oxide Membrane in Si using ELNES Separation";
    Vortrag: Microscopy of Semiconducting Materials, Churchill College Cambridge, Großbritanien; 31.03.2003 - 03.04.2003.

  244. M. Stöger-Pollach, E. Shirley, P. Schattschneider:
    "Investigating the dielectric properties of silicon by means of valence EELS in a TEM";
    Poster: Edge 2009, Banff; Alberta, Canada; 17.05.2009 - 22.05.2009.

  245. M. Stöger-Pollach, H.W. Zandbergen, C. Hébert, P. Schattschneider:
    "Improvement of bulk - surface ELNES separation by use of a monochromator";
    Poster: Strategies and advances in Atomic Level Spectroscopy and Analysis, Guadeloupe, French West Indies; 05.05.2002 - 09.05.2002.

  246. P.A. van Aken, St. Rubino, P. Schattschneider, C. Hébert:
    "Channelling enhanced spectroscopy of oxygen in ringwoodite";
    Vortrag: International EELS Workshop, Grundlsee; 01.05.2005 - 05.05.2005.

  247. J. Verbeeck, G. Bertoni, H. Lichte, P. Schattschneider:
    "Transmission electron microscopes as quantum optical bench for coherency experiments";
    Vortrag: European Science Foundation, Wien, Österreich (eingeladen); 04.10.2007 - 07.10.2007.

  248. B. Warot-Fonrose, C. Gatel, V. Serin, L. Calmels, P. Schattschneider:
    "Corrections on ESI data cube for energy-loss magnetic chiral dichroism : theoretical and experimental examples";
    Vortrag: International EELS Workshop, Banff, Alberta/ Canada; 17.05.2009 - 22.05.2009.

  249. B. Warot-Fonrose, F. Houdellier, C. Gatel, L. Calmels, V. Serin, P. Schattschneider, M.J. Hytch, E. Snoeck:
    "New Electron Energy Loss Magnetic Chiral Dichroism (EMCD) Configuration Using an Aberration-corrected Transmission Electron Microscope";
    Vortrag: MRS Fall Meeting 2007, Boston, USA; 26.11.2007 - 30.11.2007.

  250. A. Wolff, K. Eckstädt, W. Hetaba, M. Wißbrock, N. Mill, S. Löffler, N. Sewald, P. Schattschneider, A. Hütten:
    "Synthetic Polypeptide c25-mms6 alters Cobalt Ferrite Nanoparticle Growth";
    Vortrag: 16. Deutsche Physikerinnentagung, Freiburg; Deutschland; 25.10.2012 - 28.10.2012.

  251. A. Wolff, K. Frese, M. Wißbrock, K. Eckstädt, I. Ennen, W. Hetaba, S. Löffler, A. Regtmeier, P. Thomas, N. Sewald, P. Schattschneider, A. Hütten:
    "Influence of the synthetic polypeptide c25-mms6 on nanoparticle growth";
    Vortrag: DPG Frühjahrstagung Berlin, Berlin, Deutschland; 25.03.2012 - 30.03.2012.

  252. A. Wolff, W. Hetaba, N. Mill, M. Wissbrock, S. Löffler, P. Schattschneider, N. Sewald, A. Hütten:
    "Biomimetics: A promising route to obtain magnetically anisotropic";
    Poster: Fifth Seeheim Conference on Magnetism 2013, Universität Bielefeld, Frankfurt, BRD; 29.09.2013 - 03.10.2013.

  253. A. Wolff, I. Yahiatene, W. Hetaba, N. Mill, M. Wissbrock, S. Löffler, K. Eckstädt, N. Sewald, P. Schattschneider, A. Hütten:
    "Understanding the protein-inorganic crystal interaction in bioinspired syntheses";
    Poster: DPG spring meeting Regensburg 2013, Universität Regensburg, BRD; 10.03.2013 - 15.03.2013.


Dissertationen (eigene und begutachtete)


  1. Z. Feng:
    "Investigation of the electron momentum density of solids by electron energy loss spectroscopy";
    Betreuer/in(nen), Begutachter/in(nen): P. Schattschneider, F. Hofer; E052/USTEM, 2014; Rigorosum: 26.03.2014.

  2. W. Hetaba:
    "The Theory and Application of Inelastic Coherence in the Electron Microscope";
    Betreuer/in(nen), Begutachter/in(nen): P. Schattschneider, R. Schlögl, F. Hofer; 138, 2015; Rigorosum: 29.10.2015.

    Zusätzliche Informationen

  3. S. Löffler:
    "Study of real space wave functions with electron energy loss spectrometry";
    Betreuer/in(nen), Begutachter/in(nen): P. Schattschneider, J. Meyer; E052/ Ustem, 2013; Rigorosum: 09.12.2013.

  4. S. Löffler:
    "Untersuchung von Wellenfunktionen im Realraum mittels Elektronenenergieverlustspektrometrie";
    Betreuer/in(nen), Begutachter/in(nen): P. Schattschneider, J. Meyer; Institut für Festkörperphysik, 2013; Rigorosum: 12/2013.

  5. St. Rubino:
    "Magnetic Circular Dichroism in the Transmission Electron Microscope";
    Betreuer/in(nen), Begutachter/in(nen): P. Schattschneider, E. Carlino; Festkörperphysik, 2008; Rigorosum: 01/2008.

    Zusätzliche Informationen

  6. T. Schachinger:
    "Electron Vortex Beams: Production and Application";
    Betreuer/in(nen), Begutachter/in(nen): P. Schattschneider, H. Hutter, A. Hütten, H. Leeb; Universitäre Service-Einrichtung für Transmissions-Elektronenmikroskopie, 2019; Rigorosum: 27.06.2019.

  7. M. Stöger-Pollach:
    "Advanced methods in electron energy loss spectrometry and energy filtered transmission electron microscopy: Application to the Aluminium Induced Layer Exchange in Si thin film solar cells";
    Betreuer/in(nen), Begutachter/in(nen): P. Schattschneider; Institut für Festkörperphysik, 2004.

  8. G. Tasneem:
    "Energy and angular distribution of photoelectrons for ultra thin film metrology";
    Betreuer/in(nen), Begutachter/in(nen): W.S.M. Werner, P. Schattschneider; Institut für Angewandte Physik (IAP), 2010; Rigorosum: 20.12.2010.


Diplom- und Master-Arbeiten (eigene und betreute)


  1. S. Clair:
    "EELS Feinstruktur der Cu L_23 Ionisationskante in CuNi Legierungen";
    Betreuer/in(nen): P. Schattschneider, C. Eisenmenger-Sittner; Institut für Angewandte und Technische Physik, 1999.

  2. W. Hetaba:
    "Fine structure and site specific energy loss spectra of NiO";
    Betreuer/in(nen): P. Schattschneider; Institut für Festkörperphysik, 2011.

    Zusätzliche Informationen

  3. M. Kostner:
    "Effect of the excited state lifetime on the fine structure of ionization edges";
    Betreuer/in(nen): P. Schattschneider; Institut für angewandte und technische Physik, 2001.

  4. M. Maier:
    "The effect of the core hole in EELS of some metals and their oxides";
    Betreuer/in(nen): P. Schattschneider; Institut für Angewandte und Technische Physik, 2001.

  5. A. Montgermont:
    "Diffusionskinetik des aluminium-induzierten Schichtaustausches in Si-Solarzellen";
    Betreuer/in(nen): P. Schattschneider, M. Stöger-Pollach; Institut für Festkörperphysik, 2004.

  6. V. Motsch:
    "Diagonalization of the mixed dynamic form factor for mapping orbital information";
    Betreuer/in(nen): P. Schattschneider; Institut für Festkörperphysik, 2012.

    Zusätzliche Informationen

  7. D. Öfferlbauer:
    "Elektronenenergieverlustspektrometrie an chalkopyriten";
    Betreuer/in(nen): P. Schattschneider; Institut für Angewandte und Technische Physik, 1999.

  8. A. Satz:
    "Lifetime Effects in Electron Energy Loss Spectrometry";
    Betreuer/in(nen): P. Schattschneider, C. Hébert; Institut für Festkörperphysik, 2006.

  9. T. Schachinger:
    "Electron Vortex Beams in Magnetic Fields";
    Betreuer/in(nen): P. Schattschneider; E052/USTEM, 2014; Abschlussprüfung: 21.01.2014.

  10. M. Stöger-Pollach:
    "TEM and EELS microanalysis of polycrystalline silicon thin films for solar cells";
    Betreuer/in(nen): P. Schattschneider; Institut für Angewandte und Technische Physik, 1999.

  11. S. Weichselbaum:
    "Angle resolved electron energy loss spectrometry on carbon structures";
    Betreuer/in(nen): P. Schattschneider; Institut für Angewandte und Technische Physik, 1999.

  12. M. Willinger:
    "Investigation of the Oxygen K Edge Fine Structure in Vanadium Oxides";
    Betreuer/in(nen): P. Schattschneider; Institut für Festkörperphysik, 2002.

  13. M. Zauner:
    "Multislice approach for high resolution energy filtered inelastic image simulation";
    Betreuer/in(nen): P. Schattschneider; Institut für Festkörperphysik, 2010.


Wissenschaftliche Berichte


  1. B. Rau, J. Klein, J. Schneider, M. Muske, E. Conrad, I. Sieber, M. Stöger-Pollach, P. Schattschneider, K. Petter, S. Brehme, S. Gall, K. Lips, W. Fuhs:
    "Low -temperature Si epitaxy on polycrystalline Si seed layers on glass for thin-film Si solar cells";
    Bericht für Hahn-Meitner-Institut Berlin, BRD; 2004; 2 S.

  2. B. Rau, J. Klein, J. Schneider, M. Muske, E. Conrad, I. Sieber, M. Stöger-Pollach, P. Schattschneider, K. Petter, S. Brehme, S. Gall, K. Lips, W. Fuhs:
    "Low -temperature Si epitaxy on polycrystalline Si seed layers on glass for thin-film Si solar cells; Annual Report 2004, Selected Results";
    Bericht für Hahn-Meitner-Institut Berlin; 2005; 2 S.

  3. P. Schattschneider:
    "Improvement of ELNES interpretation";
    Bericht für FWF, Projektnummer: P14038-N02; 2002.

  4. P. Schattschneider, C. Hébert:
    "Improvement of ELNES interpretation";
    Bericht für FWF Projekt P14038-PHY; 2004.

  5. P. Schattschneider, St. Rubino, C. Hébert:
    "Report of the Kick-off meeting for the CHIRALTEM project";
    Bericht für EU Projekt CHIRALTEM; 2004.

  6. M. Stöger-Pollach, D. Eyidi, P. Schattschneider:
    "Meteor Contractor's Report";
    Bericht für EU Projekt Meteor; 2005; 12 S.

  7. M. Stöger-Pollach, P. Schattschneider:
    "Contractor's Report";
    Bericht für EU Projekt Meteor; 2005; 2 S.

  8. M. Stöger-Pollach, P. Schattschneider:
    "Contractor's Report";
    Bericht für EU - Bericht für EU Projekt Meteor; 2005; 2 S.

  9. M. Stöger-Pollach, P. Schattschneider:
    "Meteor - Final Technical Report";
    Bericht für EU Projekt Meteor; 2005; 2 S.

  10. M. Stöger-Pollach, P. Schattschneider:
    "Meteor workpackage report WP5";
    Bericht für EU Projekt Meteor; 2005; 2 S.

  11. M. Stöger-Pollach, P. Schattschneider:
    "Meteor workpackage report WP5";
    Bericht für EU - Bericht für EU Projekt Meteor; 2005; 2 S.

  12. M. Stöger-Pollach, P. Schattschneider:
    "MID-Term Report "Metal-Induced Crystallisation and Epitaxial Deposition for Thin, Efficient and Low-Cost Crystalline Si Solar Cells";
    Bericht für EU-Projekt METEOR; 2003.

  13. M. Stöger-Pollach, P. Schattschneider:
    "Overview of WP 5-situation at T0+12";
    Bericht für EU-Projekt METEOR; 2003.

  14. M. Stöger-Pollach, P. Schattschneider, D. Eyidi:
    "Meteor workpackage report WP5";
    Bericht für EU Projekt Meteor; 2005; 3 S.